Elemental sensitivity in soft x-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft x-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers. (c) 2007 Optical Society of America.
Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector
Calegari F;Vozzi C;Poletto L;Sansone G;Villoresi P;Nisoli M;De Silvestri S;Stagira S
2007
Abstract
Elemental sensitivity in soft x-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft x-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers. (c) 2007 Optical Society of America.File in questo prodotto:
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