The effect of O implantation in crystalline Ge on the density of native point defects has been investigated through transmission electron microscopy and B diffusion experiments. Annealing at 650 degrees C following O implants produces a band of defects (similar to 5-10 nm), compatible with GeO2 nanoclusters (NCs). A clear shape transformation from elongated to spherical forms occurs within 2 h, concomitant with a transient enhanced diffusion of B. A large injection of self-interstitials from GeO2 NCs, giving a vacancy undersaturation, and a long-range migration of self-interstitials are evidenced and discussed.

Self-interstitials injection in crystalline Ge induced by GeO2 nanoclusters

GG Scapellato;S Boninelli;E Napolitani;E Bruno;S Mirabella;D De Salvador;C Spinella;F Priolo
2011

Abstract

The effect of O implantation in crystalline Ge on the density of native point defects has been investigated through transmission electron microscopy and B diffusion experiments. Annealing at 650 degrees C following O implants produces a band of defects (similar to 5-10 nm), compatible with GeO2 nanoclusters (NCs). A clear shape transformation from elongated to spherical forms occurs within 2 h, concomitant with a transient enhanced diffusion of B. A large injection of self-interstitials from GeO2 NCs, giving a vacancy undersaturation, and a long-range migration of self-interstitials are evidenced and discussed.
2011
Istituto per la Microelettronica e Microsistemi - IMM
Istituto per la Microelettronica e Microsistemi - IMM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/172610
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