X-ray diffraction analyses using symmetrical and asymmetrical reflections were performed on YBa2Cu3O7-x films grown in situ by pulsed laser deposition. Monocrystalline (100) oriented SrTiO3, MgO and YSZ were used as substrates. The measurements allowed the calculation of the film lattice parameters and the determination of the film-substrate epitaxial relationships. The in-plane and out-plane film textures were also studied. The critical current density between 17 K and 87 K was measured in narrow strips patterned by a direct writing laser system. A comparative discussion of the results obtained for the transport properties and the structural characteristics was carried out for films grown on MgO.
Structural and electrical characterization of Y-Ba-Cu-O thin films grown on different substrates
RNipoti;
1992
Abstract
X-ray diffraction analyses using symmetrical and asymmetrical reflections were performed on YBa2Cu3O7-x films grown in situ by pulsed laser deposition. Monocrystalline (100) oriented SrTiO3, MgO and YSZ were used as substrates. The measurements allowed the calculation of the film lattice parameters and the determination of the film-substrate epitaxial relationships. The in-plane and out-plane film textures were also studied. The critical current density between 17 K and 87 K was measured in narrow strips patterned by a direct writing laser system. A comparative discussion of the results obtained for the transport properties and the structural characteristics was carried out for films grown on MgO.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
