The level of an Fe-doped InP melt in a growth crucible is kept constant throughout a Czochralski growth experiment by replenishing it with undoped melt from a second crucible. Since the distribution coefficient of iron is very small (about 0.001), the Fe concentration in the growth crucible is virtually unchanged during the pulling. As a result the ingot obtained exhibits axial Fe concentration much more uniform than in standard LEC crystals. This growth method can increase the yield of semi-insulating InP wafers as it prevents the accumulation of iron and the formation of precipitates in the last to freeze part of the crystal.

Growth of semi-insulating InP with uniform axial Fe-doping by a double-crucible LEC technique

R Fornari;E Gilioli;A Zappettini;G Mignoni;G Zuccalli
1997

Abstract

The level of an Fe-doped InP melt in a growth crucible is kept constant throughout a Czochralski growth experiment by replenishing it with undoped melt from a second crucible. Since the distribution coefficient of iron is very small (about 0.001), the Fe concentration in the growth crucible is virtually unchanged during the pulling. As a result the ingot obtained exhibits axial Fe concentration much more uniform than in standard LEC crystals. This growth method can increase the yield of semi-insulating InP wafers as it prevents the accumulation of iron and the formation of precipitates in the last to freeze part of the crystal.
1997
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
InP
Fe-doping
Fe segregation
LEC
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/177930
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