The DJOSER analytical thermal solver for multilayer mounting structures has been tested as a useful and friendly tool for the thermal analysis of power electronic devices and their packages, able to replace the onerous programs based on the finite element method (FEM) calculations. The other problem connected with the packaging evaluation is the calculation of the thermally induced stresses and strains in the various layers composing the assembling structures. This paper deals with the first step of the implementation of a thermomechanical solver to be connected with the DJOSER program, which is able to calculate the stresses at the layer interfaces, using the same strategy, i.e., a semianalytical mathematical approach, as well as the same structural models (stepped pyramidal structures and homogeneous layers). The basic theory is briefly exposed and the method is applied to some two-layer virtual structures. The obtained results are compared with those obtained using standard FEM analyses.

A thermomechanical solver for multilayer power electronic assemblies integrated into the DJOSER thermal simulator

Padovani C;Pagni A;Pasquinelli G
2011

Abstract

The DJOSER analytical thermal solver for multilayer mounting structures has been tested as a useful and friendly tool for the thermal analysis of power electronic devices and their packages, able to replace the onerous programs based on the finite element method (FEM) calculations. The other problem connected with the packaging evaluation is the calculation of the thermally induced stresses and strains in the various layers composing the assembling structures. This paper deals with the first step of the implementation of a thermomechanical solver to be connected with the DJOSER program, which is able to calculate the stresses at the layer interfaces, using the same strategy, i.e., a semianalytical mathematical approach, as well as the same structural models (stepped pyramidal structures and homogeneous layers). The basic theory is briefly exposed and the method is applied to some two-layer virtual structures. The obtained results are compared with those obtained using standard FEM analyses.
2011
Istituto di Scienza e Tecnologie dell'Informazione "Alessandro Faedo" - ISTI
Thermomechanical analysis
Electronic devices
Finite element method
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/18640
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