We show, for the first time, that undoped InP samples annealed in vacuum turn out to be semi-insulating if the cooling after the high temperature treatment (around 900 degrees C) is sufficiently slow (around 30 degrees C h(-1)). However, the best semi-insulating properties (p > 10(7) Omega cm; mu approximate to 4000 cm(2) V-1 s(-1)) are achieved with a double anneal under vacuum of InP with residual carrier concentration less than 4 x 10(15) cm(-3). It is also shown that InP specimens with n approximate to 10(16) cm(-3) can exhibit high resistivity, but lower mobility, after sequential thermal treatments. The conductivity conversion is ascribed to the overlap of two phenomena: (i) in-diffusion of deep impurities and (ii) generation-incorporation of ''shallow'' accepters. It was also observed that annealed semi-insulating samples resumed the semiconducting behavior after a second thermal treatment and quenching. This suggests that the concentration of both types of annealing related levels are dependent on the cooling rate.

Preparation and characterization of semi-insulating undoped indium phosphide

E Gombia;R Mosca;
1994

Abstract

We show, for the first time, that undoped InP samples annealed in vacuum turn out to be semi-insulating if the cooling after the high temperature treatment (around 900 degrees C) is sufficiently slow (around 30 degrees C h(-1)). However, the best semi-insulating properties (p > 10(7) Omega cm; mu approximate to 4000 cm(2) V-1 s(-1)) are achieved with a double anneal under vacuum of InP with residual carrier concentration less than 4 x 10(15) cm(-3). It is also shown that InP specimens with n approximate to 10(16) cm(-3) can exhibit high resistivity, but lower mobility, after sequential thermal treatments. The conductivity conversion is ascribed to the overlap of two phenomena: (i) in-diffusion of deep impurities and (ii) generation-incorporation of ''shallow'' accepters. It was also observed that annealed semi-insulating samples resumed the semiconducting behavior after a second thermal treatment and quenching. This suggests that the concentration of both types of annealing related levels are dependent on the cooling rate.
1994
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Indium phosphide; Semi-insulating; Electrical properties; Thermal anneal
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/188900
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