The electrical characteristics of InAs quantum dot and quantum well structures embedded in GaAs confining layers have been compared and interpreted with the effect of the potential barrier and recharging processes of quantum dots and quantum well

Growth and electrical characteristics of InAs/GaAs quantum well and quantum dot structures

P Frigeri;E Gombia;R Mosca;S Franchi
2000

Abstract

The electrical characteristics of InAs quantum dot and quantum well structures embedded in GaAs confining layers have been compared and interpreted with the effect of the potential barrier and recharging processes of quantum dots and quantum well
2000
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Quantum dots
Quantum wells
Molecular beam epitaxy growth of embedded heterostructures
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/193369
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? 16
social impact