We propose a new method to obtain surface holographic images at an atomic level by inversion of angle-resolved electron-energy-loss data. The diffraction information is contained in the intensity of a core loss peak measured in fixed directions as a function of the primary beam energy. The results obtained for the model system Ni(111)-p(2 x 2)-K show that our method is valid and promising.

Surface Holography by Angle Resolved Electron Energy Loss Spectroscopy

SScalese;
1996

Abstract

We propose a new method to obtain surface holographic images at an atomic level by inversion of angle-resolved electron-energy-loss data. The diffraction information is contained in the intensity of a core loss peak measured in fixed directions as a function of the primary beam energy. The results obtained for the model system Ni(111)-p(2 x 2)-K show that our method is valid and promising.
1996
Istituto per la Microelettronica e Microsistemi - IMM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/195842
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