New developments with the focus-wavelength encoded optical profilometer are reported in the area of applications to surface contouring. Longitudinal chromatic dispersion of a suitably designed lens as a probe is exploited to obtain distance information between the probe and the surface. After proper scanning, the surface topography is recovered.
Scanning aspherical surfaces with the focus-wavelength encoded profilometer
F Francini;G Molesini;F Quercioli;B Tiribilli
1986
Abstract
New developments with the focus-wavelength encoded optical profilometer are reported in the area of applications to surface contouring. Longitudinal chromatic dispersion of a suitably designed lens as a probe is exploited to obtain distance information between the probe and the surface. After proper scanning, the surface topography is recovered.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
