As-grown semiconducting InP wafers containing iron at a level between 5 and 8x10(15) cm(-3) were seen to convert to semi-insulating, with high resitivity and good mobility, after a thermal treatment at 900 degrees C. This fact is interesting since it allows the preparation of semi-insulating InP with Fe content substantially lower than in standard LEC material. In this paper we report the annealing parameters and the results of an extensive electro-optical characterization of the treated samples. The experimental results suggest that the conductivity drop is mainly due to a considerable loss of shallow donors

Annealing-related conductivity conversion in lightly Fe-doped n-type InP wafers

R Fornari;A Zappettini;E Gombia;R Mosca;
1996

Abstract

As-grown semiconducting InP wafers containing iron at a level between 5 and 8x10(15) cm(-3) were seen to convert to semi-insulating, with high resitivity and good mobility, after a thermal treatment at 900 degrees C. This fact is interesting since it allows the preparation of semi-insulating InP with Fe content substantially lower than in standard LEC material. In this paper we report the annealing parameters and the results of an extensive electro-optical characterization of the treated samples. The experimental results suggest that the conductivity drop is mainly due to a considerable loss of shallow donors
1996
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
0-7803-3179-6
InP wafers
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/210374
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