We have investigated the deep electronic levels in n-In0.35Ga0.65As epitaxial layers grown by molecular beam epitaxy (MBE) on graded InxGa1-xAs buffer/GaAs structures. InxGa1-xAs buffer layers with linear, parabolic and power composition grading law, respectively have been considered. The dependence of the deep levels distribution on the buffer grading law as well as on growth parameters such as the growth temperature and use of As-2 or As-4 beams is reported.

Deep level investigation on n-In0.35Ga0.65As/GaAs structures

Gombia E;Mosca R;Motta A;Nasi L;Franchi;
1998

Abstract

We have investigated the deep electronic levels in n-In0.35Ga0.65As epitaxial layers grown by molecular beam epitaxy (MBE) on graded InxGa1-xAs buffer/GaAs structures. InxGa1-xAs buffer layers with linear, parabolic and power composition grading law, respectively have been considered. The dependence of the deep levels distribution on the buffer grading law as well as on growth parameters such as the growth temperature and use of As-2 or As-4 beams is reported.
1998
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
MOLECULAR-BEAM EPITAXY; MISFIT DISLOCATIONS; GAAS; HETEROSTRUCTURES; ELECTRON STATES; TRAPS
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/210398
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