Metal-Semiconductor Field Effect Transistors (MESFETs) were fabricated on polycrystalline diamond. Devices were realized to be employed in Microwave Integrated Circuits for satellite communications and high frequency power amplification, areas were diamond promise the replacement of vacuum electronics. Fabricated MESFETs typically showed high drain-source current (140 ma/mm) and large transconductance values (50 ms/mm), with a cut off frequency f(t)=10 GHz and a maximum oscillation frequency, f(max), up to 35 GHz. These values suggest device microwave operation and are obtained through the fabrication of devices with geometry and active region dimensions (200-500 nm gate length) compatible with available microelectronic technologies.

MESFETs on H-terminated polycrystalline diamond

E Giovine;
2009

Abstract

Metal-Semiconductor Field Effect Transistors (MESFETs) were fabricated on polycrystalline diamond. Devices were realized to be employed in Microwave Integrated Circuits for satellite communications and high frequency power amplification, areas were diamond promise the replacement of vacuum electronics. Fabricated MESFETs typically showed high drain-source current (140 ma/mm) and large transconductance values (50 ms/mm), with a cut off frequency f(t)=10 GHz and a maximum oscillation frequency, f(max), up to 35 GHz. These values suggest device microwave operation and are obtained through the fabrication of devices with geometry and active region dimensions (200-500 nm gate length) compatible with available microelectronic technologies.
2009
Istituto di fotonica e nanotecnologie - IFN
Inglese
ULIS 2009: 10TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION OF SILICON
10th International Conference on Ultimate Integration on Silicon
257
260
978-1-4244-3705-4
IEEE, 345 E 47TH ST, NY 10017
NEW YORK
STATI UNITI D'AMERICA
Sì, ma tipo non specificato
MAR 18-20, 2009
Aachen, GERMANY
diamond
carbon based electronics
device technology
electrical characteristics
semiconductor devices
wide band semiconductors
1
none
P. Calvani ; F. Sinisi ; M.C. Rossi ; G. Conte ; E. Giovine ; W. Ciccognani ; E. Limiti
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/217368
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