A new non-disturbing optically interrogated silicon sensor for measuring electromagnetic power in the microwave and millimetre-wave range is presented. A prototype was realised and then tested in the microwave frequency range 2.5-18GHz. A minimum detectable electromagnetic power density of approx. 1.4mW/cm 2 was measured. Higher performances are expected, according to simulations, in optimised devices.

All-silicon optically-interrogated power sensor for microwaves and millimetre waves

Rendina;
1999

Abstract

A new non-disturbing optically interrogated silicon sensor for measuring electromagnetic power in the microwave and millimetre-wave range is presented. A prototype was realised and then tested in the microwave frequency range 2.5-18GHz. A minimum detectable electromagnetic power density of approx. 1.4mW/cm 2 was measured. Higher performances are expected, according to simulations, in optimised devices.
1999
Coaxial cables
Electromagnetic compatibility
Electromagnetic fields
Microwave circuits
Microwaves
Millimeter waves
Monochromators
Refractive index
Silicon wafers
All silicon optically interrogated power sensor
Fabry-Perot optical cavity
Optical sensors
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/217685
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