This work describes a nonparametric algorithm suitable for scene classification, either supervised or not, starting from a number of pixel features derived from SAR observations. Pixel vectors composed by simple features derived from the backscatter coefficients of one or more bands and/or polarizations are iteratively clustered into dynamically upgraded classes. Possible "a priori" knowledge coming from ground truth data may be used to initialize the procedure, but is not mandatory. Experiments on MAC-91 NASA/JPL AIRSAR data on the Montespertoli test site show that seven features derived from each of L-HV and P-HV observations are capable to discriminate seven agricultural cover classes with an overall pixel accuracy of 60%, when the algorithm learns from 10% of the truth data and classifies the remaining 90%.

Nonparametric classification of SAR data based on a modified iterated nearest-mean reclustering of pixel features

B Aiazzi;L Alparone;S Baronti;M Bianchini;G Macelloni;S Paloscia
2002

Abstract

This work describes a nonparametric algorithm suitable for scene classification, either supervised or not, starting from a number of pixel features derived from SAR observations. Pixel vectors composed by simple features derived from the backscatter coefficients of one or more bands and/or polarizations are iteratively clustered into dynamically upgraded classes. Possible "a priori" knowledge coming from ground truth data may be used to initialize the procedure, but is not mandatory. Experiments on MAC-91 NASA/JPL AIRSAR data on the Montespertoli test site show that seven features derived from each of L-HV and P-HV observations are capable to discriminate seven agricultural cover classes with an overall pixel accuracy of 60%, when the algorithm learns from 10% of the truth data and classifies the remaining 90%.
2002
Istituto di Fisica Applicata - IFAC
Inglese
Proceedings of IEEE IGARSS 2002: Remote Sensing: Integrating Our View of the Planet
IEEE IGARSS 2002, 2002 IEEE International Geoscience and Remote Sensing Symposium
4
1947
1949
3
0-7803-7536-X
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1026408
IEEE-Institute Of Electrical And Electronics Engineers Inc.
Piscataway
STATI UNITI D'AMERICA
Sì, ma tipo non specificato
24-28 Giugno 2002
Toronto, Canada
Nonparametric classification
SAR observations
pixel features
iterated nearest-mean reclustering
AIRSAR data
6
none
Aiazzi, B; Alparone, L; Baronti, S; Bianchini, M; Macelloni, G; Paloscia, S
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/233765
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