GdSr2RuCu2O8 oriented thin films were prepared by dc sputtering. The films deposited between 870 and 900 °C exhibited c-axis oriented GdSr2RuCu2O8 phase after an appropriate ex situ thermal treatment in oxygen atmosphere. X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive spectrometry (EDS) were used to analyze the crystal structure, the surface morphology and the film composition, respectively. The investigations performed on the samples before and after oxygen annealing pointed out an increasing of the structural order and a strong lowering of the resistivity. On the other hand, the data also showed an increasing of the surface roughness in oriented samples.
Morphological and Structural Characterization of GdSr2RuCu2O8 Thin Films
AVecchione;MGombos;
2006
Abstract
GdSr2RuCu2O8 oriented thin films were prepared by dc sputtering. The films deposited between 870 and 900 °C exhibited c-axis oriented GdSr2RuCu2O8 phase after an appropriate ex situ thermal treatment in oxygen atmosphere. X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive spectrometry (EDS) were used to analyze the crystal structure, the surface morphology and the film composition, respectively. The investigations performed on the samples before and after oxygen annealing pointed out an increasing of the structural order and a strong lowering of the resistivity. On the other hand, the data also showed an increasing of the surface roughness in oriented samples.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
