We report on the fabrication and characterization of planar waveguides in an Er-doped tungsten-tellurite glass by implantation of 3.5 MeV N + ions. Implantations were carried out in a wide fluence range of 1 · 10 16 8 · 10 16 ions/cm 2. Waveguides were characterized by m-line spectroscopy and spectroscopic ellipsometry. Irradiation-induced refractive index modulation saturated around a fluence of 8 · 10 16 ions/cm 2. Waveguides operating at 1550 nm were obtained in that material using 3.5 MeV N + ion implantation.
MeV energy N+-Implanted planar optical waveguides in Er-doped tungsten-tellurite glass operating at 1.55 micron.
S Berneschi;M Bettinelli;M Brenci;G Nunzi Conti;S Pelli;
2012
Abstract
We report on the fabrication and characterization of planar waveguides in an Er-doped tungsten-tellurite glass by implantation of 3.5 MeV N + ions. Implantations were carried out in a wide fluence range of 1 · 10 16 8 · 10 16 ions/cm 2. Waveguides were characterized by m-line spectroscopy and spectroscopic ellipsometry. Irradiation-induced refractive index modulation saturated around a fluence of 8 · 10 16 ions/cm 2. Waveguides operating at 1550 nm were obtained in that material using 3.5 MeV N + ion implantation.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
