In this paper the realization and the characterization of a new kind of resonant cavity enhanced photodetector (RCE), fully compatible with silicon microelectronic technologies and working at 1.55 ?m, are reported.

Fabrication and characterization of resonant cavity enhanced silicon photodetectors at 1.55 ?m

Casalino M;Sirleto L;Gioffrè M;Coppola G;Iodice M;Rendina I
2008

Abstract

In this paper the realization and the characterization of a new kind of resonant cavity enhanced photodetector (RCE), fully compatible with silicon microelectronic technologies and working at 1.55 ?m, are reported.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/237070
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