Surfaces of cubic silicon carbide (3C-SiC), grown by vapour phase epitaxy with silane and propane as precursors, were treated with plasma to remove residual species deposited during the growth procedure and the sample cooling down, or due to atmospherical contamination. The impurity traces were investigated with optical absorption spectroscopy. No morphology changes due to the plasma exposure were observed.

Plasma Treatment of 3C-SiC Surfaces

Attolini G;Bosi M
2013

Abstract

Surfaces of cubic silicon carbide (3C-SiC), grown by vapour phase epitaxy with silane and propane as precursors, were treated with plasma to remove residual species deposited during the growth procedure and the sample cooling down, or due to atmospherical contamination. The impurity traces were investigated with optical absorption spectroscopy. No morphology changes due to the plasma exposure were observed.
2013
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
3C-SiC
FT-IR
Plasma
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/246958
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