We describe a method for the direct epitaxial growth of a single photon emitter, based on GaAs quantum dots fabricated by droplet epitaxy, working at liquid nitrogen temperature on Si substrates. The achievement of quantum photon statistics up to T=80 K is directly provided by antibunching in the second order correlation function as measured with a Hanbury Brown and Twiss interferometer.

High Quality GaAs single photon emitters on Si substrate

C FRIGERI;
2013

Abstract

We describe a method for the direct epitaxial growth of a single photon emitter, based on GaAs quantum dots fabricated by droplet epitaxy, working at liquid nitrogen temperature on Si substrates. The achievement of quantum photon statistics up to T=80 K is directly provided by antibunching in the second order correlation function as measured with a Hanbury Brown and Twiss interferometer.
2013
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
978-0-7354-1194-4
Single photon
emitter
GaAs/Si
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/250666
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