The presence of crossing points in the forward J(D)-V-D curves of 4H-SiC pin diodes is analyzed by means of numerical and analytical models. The analysis allows one to justify the different temperature coefficients reported in the literature for SiC diodes and the interlacing behavior of their J(D)-V-D curves. A simple formula for predicting the position of the crossing-point is proposed.

On the Crossing-Point of 4H-SiC Power Diodes Characteristics

Nipoti Roberta;
2014

Abstract

The presence of crossing points in the forward J(D)-V-D curves of 4H-SiC pin diodes is analyzed by means of numerical and analytical models. The analysis allows one to justify the different temperature coefficients reported in the literature for SiC diodes and the interlacing behavior of their J(D)-V-D curves. A simple formula for predicting the position of the crossing-point is proposed.
2014
Istituto per la Microelettronica e Microsistemi - IMM
Inglese
35
2
244
246
3
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6685891
Sì, ma tipo non specificato
Diodes
semiconductor device modeling
4H-polytype of silicon carbide (4H-SiC)
ion implantation
1
info:eu-repo/semantics/article
262
Di Benedetto, Luigi; Licciardo, Gian Domenico; Nipoti, Roberta; Bellone, Salvatore
01 Contributo su Rivista::01.01 Articolo in rivista
none
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/262165
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 22
  • ???jsp.display-item.citation.isi??? 18
social impact