A new zirconium complex, bis-(ethylmethylamido)-bis-(N,N-diisopropyl-2-ethylmethylamidoguanidinato)- zirconium(IV) {[(NiPr)2C(NEtMe)]2Zr(NEtMe)2}, was synthesised by partial replacement of amide ligands with bidentate guanidinate ligands. The monomeric Zr complex was characterised by 1H-NMR, 13C-NMR, EI-MS, elemental analysis, and single crystal X-ray diffraction studies. The thermal properties of the compound was studied by thermogravimetric and differential thermal analysis (TG/DTA). The new Zr compound is thermally stable and can be sublimed quantitatively which renders it promising for thin film growth using vapor deposition techniques like chemical vapor deposition (CVD) and atomic layer deposition (ALD). The use of this complex for CVD of ZrO2 on Si(100) substrates was attempted in combination with oxygen as the oxidant. Stoichiometric ZrO2 films with preferred orientation at lower growth temperatures was obtained and the films were almost carbon free. The preliminary electrical characterisation of ZrO2 films showed encouraging results for possible applications in dielectric oxide structures.

Synthesis and characterisation of zirconium-amido guanidinato complex: a potential precursor for ZrO2 thin films

BARRECA, DAVIDE
2007

Abstract

A new zirconium complex, bis-(ethylmethylamido)-bis-(N,N-diisopropyl-2-ethylmethylamidoguanidinato)- zirconium(IV) {[(NiPr)2C(NEtMe)]2Zr(NEtMe)2}, was synthesised by partial replacement of amide ligands with bidentate guanidinate ligands. The monomeric Zr complex was characterised by 1H-NMR, 13C-NMR, EI-MS, elemental analysis, and single crystal X-ray diffraction studies. The thermal properties of the compound was studied by thermogravimetric and differential thermal analysis (TG/DTA). The new Zr compound is thermally stable and can be sublimed quantitatively which renders it promising for thin film growth using vapor deposition techniques like chemical vapor deposition (CVD) and atomic layer deposition (ALD). The use of this complex for CVD of ZrO2 on Si(100) substrates was attempted in combination with oxygen as the oxidant. Stoichiometric ZrO2 films with preferred orientation at lower growth temperatures was obtained and the films were almost carbon free. The preliminary electrical characterisation of ZrO2 films showed encouraging results for possible applications in dielectric oxide structures.
2007
Istituto di Scienze e Tecnologie Molecolari - ISTM - Sede Milano
Inglese
1671
1676
6
Sì, ma tipo non specificato
Selezionato per la Cover Page (Dalton Transactions, 2007, 1641)
1
info:eu-repo/semantics/article
262
Barreca, Davide
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/30216
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