Space components need a ground characterization based on several solicitations, including mechanical and thermal stress, before their final qualification. In this paper, RF MEMS switches designed for redundancy logic have been extensively measured with promising results in terms of thermal and mechanical cycles. Packaging contributions have been also discussed.

Reliable response of RF MEMS LTCC packaged switches after mechanical and thermal stress

Lucibello A;Capoccia G;Proietti E;Marcelli R;Bartolucci G
2014

Abstract

Space components need a ground characterization based on several solicitations, including mechanical and thermal stress, before their final qualification. In this paper, RF MEMS switches designed for redundancy logic have been extensively measured with promising results in terms of thermal and mechanical cycles. Packaging contributions have been also discussed.
2014
Istituto per la Microelettronica e Microsistemi - IMM
Inglese
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2014
978-2-35500-028-7
http://www.scopus.com/inward/record.url?eid=2-s2.0-84926345795&partnerID=q2rCbXpz
Sì, ma tipo non specificato
1-4 April 2014
Cannes
redundancy
reliability
RF MEMS
space components
10
none
Lucibello, A; Capoccia, G; Proietti, E; Marcelli, R; Margesin, B; Mulloni, V; Giacomozzi, F; Vitulli, F; Scipioni, M; Bartolucci, G
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/304595
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