Digital holographic microscopy (DHM) has been successfully applied for the first time to characterize the radiative out-of-plane emission properties of a superdirective device. Complementarily to near-field microscopy, DHM allows us to reconstruct the beam in the far-field region. The angular dispersion of the light beam radiated from a grating composed of air and anti-air metamaterial has been determined, and the proposed technique has high-lighted a collimation degree higher than 0.04°, as already evaluated in a previous work. Further considerations on the retrieved phase map of the beam in the acquisition plane are presented. © 2012 Optical Society of America.

Digital holographic microscopy characterization of superdirective beam by metamaterial

Dardano Principia;Coppola Giuseppe;Mocella Vito
2012

Abstract

Digital holographic microscopy (DHM) has been successfully applied for the first time to characterize the radiative out-of-plane emission properties of a superdirective device. Complementarily to near-field microscopy, DHM allows us to reconstruct the beam in the far-field region. The angular dispersion of the light beam radiated from a grating composed of air and anti-air metamaterial has been determined, and the proposed technique has high-lighted a collimation degree higher than 0.04°, as already evaluated in a previous work. Further considerations on the retrieved phase map of the beam in the acquisition plane are presented. © 2012 Optical Society of America.
2012
Istituto per la Microelettronica e Microsistemi - IMM
digital holography; photonic crystals; metamaterials
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/307822
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