We report on the fabrication and electrical characterization of phase change memory (PCM) devices formed by In3Sb1Te2 chalcogenide nanowires (NWs), with diameters as small as 20 nm. The NWs were self-assembled by metal organic chemical vapor deposition via the vapor-liquid-solid method, catalyzed by Au nanoparticles. Reversible and well reproducible memory switching of the NWs between low and high resistance states was demonstrated. The conduction mechanism of the high resistance state was investigated according to a trap-limited model for electrical transport in the amorphous phase. The size of the amorphized portion of the NW and the critical electric field for the transition to the low resistance state were evaluated. The In3Sb1Te2 NW-based devices showed very low working parameters, such as RESET voltage (similar to 3 V), current (similar to 40 mu A), and power (similar to 130 mu W). Our results indicated that the studied NWs are suitable candidates for the realization of ultra-scaled, high performance PCM devices. Published by AIP Publishing.

Low power phase change memory switching of ultra-thin In3Sb1Te2 nanowires

Selmo S;Cecchini R;Cecchi S;Wiemer C;Fanciulli M;Rotunno E;Lazzarini L;Longo M
2016

Abstract

We report on the fabrication and electrical characterization of phase change memory (PCM) devices formed by In3Sb1Te2 chalcogenide nanowires (NWs), with diameters as small as 20 nm. The NWs were self-assembled by metal organic chemical vapor deposition via the vapor-liquid-solid method, catalyzed by Au nanoparticles. Reversible and well reproducible memory switching of the NWs between low and high resistance states was demonstrated. The conduction mechanism of the high resistance state was investigated according to a trap-limited model for electrical transport in the amorphous phase. The size of the amorphized portion of the NW and the critical electric field for the transition to the low resistance state were evaluated. The In3Sb1Te2 NW-based devices showed very low working parameters, such as RESET voltage (similar to 3 V), current (similar to 40 mu A), and power (similar to 130 mu W). Our results indicated that the studied NWs are suitable candidates for the realization of ultra-scaled, high performance PCM devices. Published by AIP Publishing.
2016
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Istituto per la Microelettronica e Microsistemi - IMM
Electrical resistivityAmorphous statePhase transitionsHigh voltage direct current transmissionChalcogenides
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/326176
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