The Nanomechanical characteristics of InGaP semiconductor alloys doped with Si and Zn grown on GaAs (100) semi-insulating substrate is studied. The mechanical characteristics of the material such as hardness, stiffness, contact depth etc. were studied byNanoindentation technique with different probe geometries like Berkovich and Vickers. The results show significant variation in the mechanical parameters with respect to the tip geometry and dopant concentration. © 2013 AIP Publishing LLC.

Nanomechanical studies of doped InGaP/GaAs epilayers

Attolini G;Bosi M;
2013

Abstract

The Nanomechanical characteristics of InGaP semiconductor alloys doped with Si and Zn grown on GaAs (100) semi-insulating substrate is studied. The mechanical characteristics of the material such as hardness, stiffness, contact depth etc. were studied byNanoindentation technique with different probe geometries like Berkovich and Vickers. The results show significant variation in the mechanical parameters with respect to the tip geometry and dopant concentration. © 2013 AIP Publishing LLC.
2013
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Inglese
1536
513
514
http://aip.scitation.org/doi/pdf/10.1063/1.4810326
Sì, ma tipo non specificato
Hardness
InGaP
Nanoindentation
nanomechanical
Reduced modulus
Conference: International Conference on Recent Trends in Applied Physics and Material Science (RAM) Location: Govt Coll Engn & Technol Bikaner, Bikaner, INDIA Date: FEB 01-02, 2013 Sponsor(s):Dept Sci & Technol (DST), New Delhi; Dept Sci & Technol (DST), Jaipur; Council Sci & Ind Res (CSIR)
6
info:eu-repo/semantics/article
262
Robidas, Dipika; Deepthi, K R; Arunseshan, C; Attolini, G; Bosi, M; Arivuoli, D
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/331839
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