We demonstrate the integration of bright, fully polarized single-photon emitters readily created by thermal oxidation of cubic silicon carbide (SiC) into microdisk resonators. The resonators are created by a direct laser beam writing lithography technique that is used to align the position of the resonator to a preselected single defect. Quality factors as high as 1900 are measured. We show the presence of whispering gallery modes in the emission spectrum of a single defect and an increase in the detected emission intensity. The experimental work is supported by numerical calculations of the electric field distribution in the resonators.

Integration of Single-Photon Emitters into 3C-SiC Microdisk Resonators

Bosi M;
2017

Abstract

We demonstrate the integration of bright, fully polarized single-photon emitters readily created by thermal oxidation of cubic silicon carbide (SiC) into microdisk resonators. The resonators are created by a direct laser beam writing lithography technique that is used to align the position of the resonator to a preselected single defect. Quality factors as high as 1900 are measured. We show the presence of whispering gallery modes in the emission spectrum of a single defect and an increase in the detected emission intensity. The experimental work is supported by numerical calculations of the electric field distribution in the resonators.
2017
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
microdisk resonator
nanophotonics
optical lithography
optically active defects
silicon carbide
single-photon sources
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/333500
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