Scanning probe assisted nanolithography is a very attractive technique in terms of low-cost, patterning resolution and positioning accuracy. Our approach makes use of a commercial atomic force microscope and silicon probes to build simple nanostructures, such as metal electrode pairs, for application in novel quantum devices. Sub-100 nm patterning was successfully performed using three different techniques: direct material removal, scanning probe assisted mask patterning and local oxidation.

SPM based lithography for nanometer scale electrodes fabrication

Notargiacomo A;Giovine E;
2000

Abstract

Scanning probe assisted nanolithography is a very attractive technique in terms of low-cost, patterning resolution and positioning accuracy. Our approach makes use of a commercial atomic force microscope and silicon probes to build simple nanostructures, such as metal electrode pairs, for application in novel quantum devices. Sub-100 nm patterning was successfully performed using three different techniques: direct material removal, scanning probe assisted mask patterning and local oxidation.
2000
Inglese
Materials Research Society Symposium 1999 -Material Issues and Modeling for Device Nanofabrication
584
319
324
http://www.scopus.com/record/display.url?eid=2-s2.0-0033678008&origin=inward
29/11-02/12/2000
Atomic force microscopy
Lithography
Local anodic
2
none
Notargiacomo, A.; Giovine, E.; Cianci, E.; Foglietti, V.; Evangelisti, F.
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/362205
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