Ultrafast lasers are increasing their range of applications. In non-linear optical microscopy, the laser beam properties can influence the non-linear contrast efficiency and the image quality, so monitoring of the output waveform is often required.In order to obtain images, in Stimulated Raman Scattering (SRS) microscopy, two collinear laser beams, a high-power pump laser and a low power Stokes laser with different frequencies (?L> ?S) are focused into a sample. In this paper the two laser sources, in our case a femtosecond Ti:Sapphire (Ti:Sa) oscillator and a femtosecond synchronized optical parametric oscillator (OPO) are characterized by non-linear interferometric measurements. Taking advantage of two-photon absorption (TPA), autocorrelation measurements of each laser beam and cross correlation measurements of Ti:Sa and OPO are carried out. Results are reported and discussed.

Auto and cross correlation measurements of femtosecond laser beams in SRS microscope

Ranjan R;Ferrara MA;Sirleto L
2020

Abstract

Ultrafast lasers are increasing their range of applications. In non-linear optical microscopy, the laser beam properties can influence the non-linear contrast efficiency and the image quality, so monitoring of the output waveform is often required.In order to obtain images, in Stimulated Raman Scattering (SRS) microscopy, two collinear laser beams, a high-power pump laser and a low power Stokes laser with different frequencies (?L> ?S) are focused into a sample. In this paper the two laser sources, in our case a femtosecond Ti:Sapphire (Ti:Sa) oscillator and a femtosecond synchronized optical parametric oscillator (OPO) are characterized by non-linear interferometric measurements. Taking advantage of two-photon absorption (TPA), autocorrelation measurements of each laser beam and cross correlation measurements of Ti:Sa and OPO are carried out. Results are reported and discussed.
2020
Inglese
Proceedings of 2020 Italian Conference on Optics and Photonics, ICOP 2020
9781728162393
http://www.scopus.com/record/display.url?eid=2-s2.0-85099593741&origin=inward
IEEE-Institute Of Electrical And Electronics Engineers Inc.
Piscataway
STATI UNITI D'AMERICA
Sì, ma tipo non specificato
08-11/09/2020
Parma; Italy
Nonlinear Optical Microscopy
Stimulated Raman Scattering
Raman Microscopy
3
none
Ranjan, R; Ferrara, Ma; Sirleto, L
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/403281
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