Resistivity and Hall effect measurements on n-type undoped In0.17 Ga0.83 N alloy grown by metal-organic vapor phase epitaxy (MOVPE) technique were carried out as a function of temperature (15-350 K). In0.17 Ga0.83 N alloy is regarded as a highly degenerate semiconductor system with a high carrier concentration of ∼9.2×10. 9 cm−3. An anomalous resistivity behavior is observed over the whole temperature range. The temperature dependent resistivity of In0.17 Ga0.83 N exhibits a metal-semiconductor transition (MST) around 180 K. The temperature coefficient of resistivity is negative at low temperatures (T180) and it becomes positive at relatively high temperatures (T180). In addition to this, a negative magnetoresistivity (MR) has been observed below 180 K. The temperature dependent resistivity of In0.17 Ga0.83 N alloy is explained in the terms of the electron-electron interaction (EEI) and the weak localization (WL) phenomenon at low temperatures (T180). At high temperatures (T180) the temperature dependent resistivity obeys T2 law.

Anomalous temperature dependence of the electrical resistivity in In0.17Ga0.83N

Bosi M
2009

Abstract

Resistivity and Hall effect measurements on n-type undoped In0.17 Ga0.83 N alloy grown by metal-organic vapor phase epitaxy (MOVPE) technique were carried out as a function of temperature (15-350 K). In0.17 Ga0.83 N alloy is regarded as a highly degenerate semiconductor system with a high carrier concentration of ∼9.2×10. 9 cm−3. An anomalous resistivity behavior is observed over the whole temperature range. The temperature dependent resistivity of In0.17 Ga0.83 N exhibits a metal-semiconductor transition (MST) around 180 K. The temperature coefficient of resistivity is negative at low temperatures (T180) and it becomes positive at relatively high temperatures (T180). In addition to this, a negative magnetoresistivity (MR) has been observed below 180 K. The temperature dependent resistivity of In0.17 Ga0.83 N alloy is explained in the terms of the electron-electron interaction (EEI) and the weak localization (WL) phenomenon at low temperatures (T180). At high temperatures (T180) the temperature dependent resistivity obeys T2 law.
2009
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
72.20.Fr
71.55.Eq
InGaN
electronic transport
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/41080
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