The effect of a 1500 degrees C treatment on 1x10(20) cm(-3) Al+ ion implanted in 4H-SiC samples that have been previously annealed at 1850-1950 degrees C is studied in this work. Up to 240 min annealing time at 1500 degrees C, the Al electrical activation reached at 1850-1950 degrees C is preserved.

Thermal stability of 1x10(20) cm(-3) Al+ implanted 4H-SiC after electrical activation at temperature >= 1850 degrees C

Nipoti R;Puzzanghera M;
2017

Abstract

The effect of a 1500 degrees C treatment on 1x10(20) cm(-3) Al+ ion implanted in 4H-SiC samples that have been previously annealed at 1850-1950 degrees C is studied in this work. Up to 240 min annealing time at 1500 degrees C, the Al electrical activation reached at 1850-1950 degrees C is preserved.
2017
Istituto per la Microelettronica e Microsistemi - IMM
978-1-62332-476-6
doping by ion implantation
4H-SiC
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/421132
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