A specific preparation procedure makes possible to obtain in one shot structural and compositional characterization of a buried interface at the nanometre scale using a micrometre scale probe. A specific example based on dispersive l-XAS, micro X-ray absorption spectroscopy, shows that nearly-atomic scale changes in local structure, composition, as well as local disorder are faithfully detected. The approach could in principle be applied to any probe with a micrometric resolution.

mu-XANES mapping of buried interfaces: pushing microbeam techniques to the nanoscale

M Zema;S C Tarantino;
2010

Abstract

A specific preparation procedure makes possible to obtain in one shot structural and compositional characterization of a buried interface at the nanometre scale using a micrometre scale probe. A specific example based on dispersive l-XAS, micro X-ray absorption spectroscopy, shows that nearly-atomic scale changes in local structure, composition, as well as local disorder are faithfully detected. The approach could in principle be applied to any probe with a micrometric resolution.
2010
Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia - ICMATE
Istituto di Geoscienze e Georisorse - IGG - Sede Pisa
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/430522
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