In this work, x-ray photoelectron spectroscopy was employed to characterize the surface composition and elemental chemical states of supportedCo3O4-SnO2 and Co3O4-Fe2O3 nanocomposites. The present materials were prepared on Si(100) substrates by the chemical vapordeposition of cobalt oxide under O2+H2O atmospheres, followed by the tailored introduction of SnO2 or Fe2O3 by means of radio frequency-sputtering. Material structural and morphological characterization revealed the formation of nanocomposite heterostructures involvinga conformal Co3O4 coverage by SnO2 or Fe2O3 overlayers. Survey spectra as well as detailed scans of C 1s, O 1s, Co 2p, Sn 3d, and Fe2p regions are presented and critically discussed. The results provide evidence for the formation of pure and oxygen-deficient nanocomposites,and the occurrence of an electronic interplay between the single oxide constituents.

Analysis of Co3O4-SnO2 and Co3O4-Fe2O3 nanosystems by x-ray photoelectron spectroscopy

Maccato C;Barreca D
;
Gasparotto A
2021

Abstract

In this work, x-ray photoelectron spectroscopy was employed to characterize the surface composition and elemental chemical states of supportedCo3O4-SnO2 and Co3O4-Fe2O3 nanocomposites. The present materials were prepared on Si(100) substrates by the chemical vapordeposition of cobalt oxide under O2+H2O atmospheres, followed by the tailored introduction of SnO2 or Fe2O3 by means of radio frequency-sputtering. Material structural and morphological characterization revealed the formation of nanocomposite heterostructures involvinga conformal Co3O4 coverage by SnO2 or Fe2O3 overlayers. Survey spectra as well as detailed scans of C 1s, O 1s, Co 2p, Sn 3d, and Fe2p regions are presented and critically discussed. The results provide evidence for the formation of pure and oxygen-deficient nanocomposites,and the occurrence of an electronic interplay between the single oxide constituents.
2021
Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia - ICMATE
Co3O4
SnO2
Fe2O3
CVD
RF-sputtering
x-ray photoelectron spectroscopy
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/443556
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