A non-perturbing, fast, low-cost probe for near-field measurements is presented in this paper. The new sensing technique's capabilities in antenna fault diagnosis and direct measurement of field intensity distribution at subwavelength distance from the sources are demonstrated by test measurement on different microwave antennas and applicators.

Direct near-field antenna testing and fault diagnosis by a silicon-probe-based optical sensing technique

Rendina I
2003

Abstract

A non-perturbing, fast, low-cost probe for near-field measurements is presented in this paper. The new sensing technique's capabilities in antenna fault diagnosis and direct measurement of field intensity distribution at subwavelength distance from the sources are demonstrated by test measurement on different microwave antennas and applicators.
2003
Istituto per la Microelettronica e Microsistemi - IMM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/49638
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