In this paper, the realization and the characterization of a resonant cavity enhanced RCE photodetector, completely silicon compatible and working at 1.55 m, are reported. The detector is a RCE structure incorporating a Schottky diode and its working principle is based on the internal photoemission effect. Taking advantage of a Cu/ Si Schottky diode fed on a high reflectivity Bragg mirror, an improvement in responsivity at 1.55 m is experimentally demonstrated.

Silicon resonant cavity enhanced photodetector based on the internal photoemission effect at 1.55 mu m: Fabrication and characterization

Casalino M;Sirleto L;Gioffre M;Coppola G;Rendina I
2008

Abstract

In this paper, the realization and the characterization of a resonant cavity enhanced RCE photodetector, completely silicon compatible and working at 1.55 m, are reported. The detector is a RCE structure incorporating a Schottky diode and its working principle is based on the internal photoemission effect. Taking advantage of a Cu/ Si Schottky diode fed on a high reflectivity Bragg mirror, an improvement in responsivity at 1.55 m is experimentally demonstrated.
2008
Istituto per la Microelettronica e Microsistemi - IMM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/49704
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