In this paper a novel photodetector at 1550 nm, working at room temperature and completely silicon compatible, is reported. The detector is a resonant cavity-enhanced structure incorporating a Schottky diode back-illuminated and its working principle is based on the internal photoemission effect. The device performances in terms of responsivity are numerically calculated for different values of bottom reflectivity. Finally, a preliminary device was realized and characterized in order to validate the theoretical results.

Back-illuminated silicon resonant cavity-enhanced photodetector at 1550 nm

Casalino M;Sirleto L;Moretti L;Gioffre M;Coppola G;Iodice M;Rendina I
2009

Abstract

In this paper a novel photodetector at 1550 nm, working at room temperature and completely silicon compatible, is reported. The detector is a resonant cavity-enhanced structure incorporating a Schottky diode back-illuminated and its working principle is based on the internal photoemission effect. The device performances in terms of responsivity are numerically calculated for different values of bottom reflectivity. Finally, a preliminary device was realized and characterized in order to validate the theoretical results.
2009
Istituto per la Microelettronica e Microsistemi - IMM
Inglese
41
6
1097
1101
5
Sì, ma tipo non specificato
7
info:eu-repo/semantics/article
262
Casalino, M; Sirleto, L; Moretti, L; Gioffre, M; Coppola, G; Iodice, M; Rendina, I
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/49748
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