Rare earth vanadate, LaVO3 (LVO) is a Mott-Hubbard insulator in which the spin, charge, and lattice degrees of freedom are intimately coupled, making them exhibit several interesting phenomena such as metal-insulator transition, ferroelectricity, 2D superconductivity etc. Epitaxial strain in LVO has a direct influence on their physical properties. This scenario provides an excellent playground to fine-tune the functionalities of LVO in electronic and spintronic devices. However, a thorough understanding of the epitaxial strain effect in LVO thin films has remained elusive due to the lack of systematic studies. This work demonstrates a wide-range epitaxial strain control of structural and electrical properties in high-quality LVO thin films. The epitaxial strain was imposed by cubic or pseudocubic perovskite substrates with a lattice mismatch ranging from -3.7 to +1.5% with respect to bulk LVO. Our results provide relevant guidelines to design LVO-based heterostructures for device applications.

Substrate driven strain effects in LaVO3 thin films grown by Pulsed Laser Deposition

Chaluvadi S. K.;Fujii J.;Vobornik I.;Mazzola F.;Orgiani P.
2023

Abstract

Rare earth vanadate, LaVO3 (LVO) is a Mott-Hubbard insulator in which the spin, charge, and lattice degrees of freedom are intimately coupled, making them exhibit several interesting phenomena such as metal-insulator transition, ferroelectricity, 2D superconductivity etc. Epitaxial strain in LVO has a direct influence on their physical properties. This scenario provides an excellent playground to fine-tune the functionalities of LVO in electronic and spintronic devices. However, a thorough understanding of the epitaxial strain effect in LVO thin films has remained elusive due to the lack of systematic studies. This work demonstrates a wide-range epitaxial strain control of structural and electrical properties in high-quality LVO thin films. The epitaxial strain was imposed by cubic or pseudocubic perovskite substrates with a lattice mismatch ranging from -3.7 to +1.5% with respect to bulk LVO. Our results provide relevant guidelines to design LVO-based heterostructures for device applications.
2023
Istituto Officina dei Materiali - IOM -
9798350335460
Epitaxial strain; Pulsed Laser Deposition; Thin films; Transport properties;
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/518937
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