We present results on model based quantification of electron energy loss spectra (EELS), focusing on the factors that influence accuracy and precision in determining chemical concentrations. Several sources of systematical errors are investigated. The spectrometer entrance aperture determines the collection angle, and the effects of its position with respect to the transmitted beam are investigated, taking into account the diffraction by the crystal structure. The effect of the orientation of the sample is tested experimentally and theoretically on SrTiO3, and finally, a simulated experiment on c-BN at different thicknesses confirms the superior results of the model based method with respect to the conventional method. A test on a set of experimental reference compounds is presented, showing that remarkably good accuracy can be obtained. Recommendations are given to achieve high accuracy and precision in practice. © 2008 Elsevier B.V. All rights reserved.

Accuracy and precision in model based EELS quantification

Bertoni G.
Primo
;
2008

Abstract

We present results on model based quantification of electron energy loss spectra (EELS), focusing on the factors that influence accuracy and precision in determining chemical concentrations. Several sources of systematical errors are investigated. The spectrometer entrance aperture determines the collection angle, and the effects of its position with respect to the transmitted beam are investigated, taking into account the diffraction by the crystal structure. The effect of the orientation of the sample is tested experimentally and theoretically on SrTiO3, and finally, a simulated experiment on c-BN at different thicknesses confirms the superior results of the model based method with respect to the conventional method. A test on a set of experimental reference compounds is presented, showing that remarkably good accuracy can be obtained. Recommendations are given to achieve high accuracy and precision in practice. © 2008 Elsevier B.V. All rights reserved.
2008
Istituto Nanoscienze - NANO - Sede Secondaria Modena
Accuracy
EELS
Electron energy loss
Model based quantification
Precision
File in questo prodotto:
File Dimensione Formato  
1-s2.0-S030439910800020X-main.pdf

solo utenti autorizzati

Descrizione: Manuscript
Tipologia: Versione Editoriale (PDF)
Licenza: NON PUBBLICO - Accesso privato/ristretto
Dimensione 496.51 kB
Formato Adobe PDF
496.51 kB Adobe PDF   Visualizza/Apri   Richiedi una copia
1-s2.0-S030439910800020X-main-AAM.pdf

accesso aperto

Descrizione: Author Accepted Manuscript
Tipologia: Documento in Post-print
Licenza: Creative commons
Dimensione 1.07 MB
Formato Adobe PDF
1.07 MB Adobe PDF Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/541245
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 53
  • ???jsp.display-item.citation.isi??? 48
social impact