Manganese ferrite films by chemical vapor deposition, analyzed by x-ray photoelectron spectroscopy

Manganese iron oxide (MnFe2O4), an environmentally friendly material, has been the subject of numerous studies for a broad range of technological end-uses. In the present work, we focus on an x-ray photoelectron spectroscopy investigation of a representative MnFe2O4 specimen grown by chemical vapor deposition on fluorine-doped tin oxide. The material was fabricated starting from homologous β-diketonate diamine Mn(II) and Fe(II) molecular precursors in an O2+H2O atmosphere, followed by ex situ annealing in an inert atmosphere. Beside the survey scan, we present and discuss high-resolution C 1s, O 1s, Mn 2p, Mn 3s, and Fe 2p spectra, recorded using a monochromated Al Kα x-ray source. Our findings provide valuable comparative data for researchers working on the preparation and characterization of manganese ferrite-containing systems for a wide range of applications.