In this paper we discuss the laser annealing crystallization of hydrogenated a-Si film deposited at 250 degrees C by means of PECVD technique. Abrupt out-diffusion of hydrogen damages the deposited layers during single shot high energy density laser annealing. On the contrary, a multisteps laser annealing approach, from low to high energy density, allows us to achieve good poly-Si film,, without any H-related defect.

Laser annealing of a-Si for realization of polycrystalline Si film on plastic substrate

Scalese S;Privitera V
2007

Abstract

In this paper we discuss the laser annealing crystallization of hydrogenated a-Si film deposited at 250 degrees C by means of PECVD technique. Abrupt out-diffusion of hydrogen damages the deposited layers during single shot high energy density laser annealing. On the contrary, a multisteps laser annealing approach, from low to high energy density, allows us to achieve good poly-Si film,, without any H-related defect.
2007
Istituto per la Microelettronica e Microsistemi - IMM
978-1-4244-1227-3
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/69276
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