Structural Characterization of sol-gel lanthanum cobaltite thin films

The present paper is focused on structural, microstructural and compositional studies onnanophasic LaCoO3 thin films obtained by the sol-gel route. The sample structure and microstructurewere investigated by Glancing Incidence X-Ray Diffraction (GIXRD) and X-Raymicrodiffraction (MicroXRD), whereas the surface and in-depth chemical composition wasstudied by X-Ray Photoelectron Spectroscopy (XPS). All the films are structurally homogeneousand not textured. A cubic-to-rhomboedral phase transition was detected after the thermaltreatment at 800°C. Evidence of residual stress was found by GIXRD patterns collectedat different incidence angles. After thermal annealing at 1000°C, only the crystalline La2O3phase was detected.