We report on the fabrication and electronic transport characterisation of Schottky-gated strongly confined Si/SiGe quantum point contacts (QPC). At zero magnetic field and T=450mK the QPC conductance as a function of gate voltage shows a quantization in units of e(2)/h, indicative of transport through 1D modes which appear to lack both spin and valley degeneracy.

Conductance Quantization in Schottky-gated Si/SiGe Quantum Point Contacts

E Giovine;A Notargiacomo;R Leoni;F Evangelisti
2007

Abstract

We report on the fabrication and electronic transport characterisation of Schottky-gated strongly confined Si/SiGe quantum point contacts (QPC). At zero magnetic field and T=450mK the QPC conductance as a function of gate voltage shows a quantization in units of e(2)/h, indicative of transport through 1D modes which appear to lack both spin and valley degeneracy.
2007
Istituto di fotonica e nanotecnologie - IFN
978-0-7354-0397-0
silicon-germanium
conductance quantization
quantum point contact
1 DEG
2DEG
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/76015
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