Foreseen operation at sub-THz frequencies of Schottky contacts for diodes and transistor gates on GaAs based heterostructures requires area reduction down to 0.1x1 microns, and wet chemical processes. We report on the compatibility of Trilayer Electron-beam Lithography with such wet processes.

Trilayer Electron-beam Lithography and Surface Preparation for Sub-micron Schottky Contacts on GaAs Heterostructures

E Giovine
2010

Abstract

Foreseen operation at sub-THz frequencies of Schottky contacts for diodes and transistor gates on GaAs based heterostructures requires area reduction down to 0.1x1 microns, and wet chemical processes. We report on the compatibility of Trilayer Electron-beam Lithography with such wet processes.
2010
Istituto di fotonica e nanotecnologie - IFN
Inglese
35TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ 2010)
IEEE Proc. of the 35th international conference on infrared millimetre and terahertz waves IRMMW-THz 2010
978-1-4244-6657-3
IEEE, 345 E 47TH ST, NY 10017
NEW YORK
STATI UNITI D'AMERICA
Sì, ma tipo non specificato
SEP 05-10, 2010
Rome, ITALY
10
none
Dominijanni a, D; C, ; Casini, R; Foglietti, V; Ortolani, M; Notargiacomo, A; Lanzieri, C; Peroni, M; Romanini, P; Giovine, E
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/80135
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