LiF films have been grown on silicon substrate, irradiated with soft x-rays to create fluorescent regular micrometric-spaced arrays based on colour centres, and studied by Scanning Near-field Optical Microscope (SNOM). Strong variations in the local reflectivity have been observed in the infrared region between 6.1 and 9.2 mm and tentatively ascribed to a modulated variation of the refractive index of the coloured zone with respect to that of the uncoloured LiF matrix.
IR-SNOM on Lithium Fluoride Films with Regular Arrays Based on Colour Centres
Cricenti A;Longo G;Mussi V;Generosi R;Luce M;Perfetti P;
2003
Abstract
LiF films have been grown on silicon substrate, irradiated with soft x-rays to create fluorescent regular micrometric-spaced arrays based on colour centres, and studied by Scanning Near-field Optical Microscope (SNOM). Strong variations in the local reflectivity have been observed in the infrared region between 6.1 and 9.2 mm and tentatively ascribed to a modulated variation of the refractive index of the coloured zone with respect to that of the uncoloured LiF matrix.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
