Sfoglia per Serie MATERIALS SCIENCE FORUM
1300°c annealing of 1×1020 al+ ion implanted 3C-SiC
2019 Nipoti, Roberta; Canino, Mariaconcetta; Bonafè, Filippo; Torregrosa, Frank; Monnoye, Sylvain; Mank, Hugues; Zielinski, Marcin
1950°C annealing of Al+ implanted 4H-SiC: Sheet resistance dependence on the annealing time
2016 Nipoti, Roberta; Parisini, Antonella; Vantaggio, Salvatore; Alfieri, Giovanni; Carnera, Alberto; Centurioni, Emanuele; Elmi, Ivan; Grossner, Ulrike
2D simulation of under-mask penetration in 4H-SiC implanted with Al(+) ions
2011 Lulli, Giorgio; Lulli, Giorgio; Nipoti, Roberta; Nipoti, Roberta
3 × 1018 - 1 × 1019 cm-3 al+ ion implanted 4h-sic: Annealing time effect
2020 Nipoti, Roberta; Parisini, Antonella; Boldrini, Virginia; Vantaggio, Salvatore; Canino, Mariaconcetta; Sanmartin, Michele; Alfieri, Giovanni
3C-SiC heteroepitaxial growth on Inverted Silicon Pyramids (ISP)
2010 D'Arrigo G.; Severino A.; Milazzo G.; Bongiorno C.; Piluso N.; Abbondanza G.; Mauceri M.; Condorelli G.; La Via F.
About the electrical activation of 1×1020 cm-3 ion implanted al in 4H-SiC at annealing temperatures in the range 1500 - 1950°C
2018 Nipoti, Roberta; Carnera, Alberto; Alfieri, Giovanni; Kranz, Lukas
About the hole transport analysis in heavy doped p-type 4H-SiC(Al)
2015 Parisini, A.; Nipoti, R.
Activation energy for the post implantation annealing of 1019cm-3 and 1020 cm-3 ion implanted al in 4H SiC.
2019 Nipoti, Roberta; Canino, Mariaconcetta; Sapienza, Sergio; Bellettato, Michele; Sozzi, Giovanna; Alfieri, Giovanni
Ag growth on 3C-SiC(001) c(2x2) C-terminated and c(4x2) Si-terminated surfaces
2002 N. Rodriguez; M. D'Angelo; V Y Aristov; P. Soukiassian; A. Lescuras; C. Croti; M. Pedio; P. Perfetti
Al+ implanted 4H-SiC p(+)-i-n diodes: Evidence for post-implantation-annealing dependent defect activation
2014 Grossner, U; Moscatelli, F; Nipoti, R
Al+ implanted 4H-SiC: improved electrical activation and ohmic contacts
2013 R. Nipoti; A. Hallén; A. Parisini; F. Moscatelli; S. Vantaggio;
Al+ ion implanted 4H-SiC vertical p+-i-n diodes: Processing dependence of leakage currents and OCVD carrier lifetimes
2017 Nipoti, R.; Puzzanghera, M.; Sozzi, G.
Al+ ion implanted on-axis <0001>semi-insulating 4H-SiC
2015 Nipoti, Roberta; Parisini, Antonella; Carnera, Alberto; Albonetti, Cristiano; Vantaggio, Salvatore; Grossner, Ulrike
Analysis of the electrical activation of P+ implanted layers as a function of the heating rate of the annealing process
2007 Canino, M; Giannazzo, F; Roccaforte, F; Poggi, A; Solmi, S; Raineri, V; Nipoti, R
Analysis of the Electron Traps at the 4H-SiC/SiO(2) Interface of a Gate Oxide Obtained by Wet Oxidation of a Nitrogen pre-Implanted Layer
2009 Pintilie, I; Moscatelli, F; Nipoti, R; Poggi, A; Solmi, S; Svensson, ; B, G
Analytical prediction of the cross-over point in the temperature coefficient of the forward characteristics of 4H-SiC p+-i-n diodes
2015 Di Benedetto, L.; Licciardo, G. D.; Bellone, S.; Nipoti, R.
Ar annealing at 1600 degrees C and 1650 degrees C of Al+ implanted p(+)/n 4H-SiC diodes: Analysis of the J-V characteristics versus annealing temperature
2005 Bergamini F.; Moscatelli F.; Canino M.; Poggi A.; Nipoti R.
Band offset engineering of II-VI/III-V heterointerfaces
1995 Franciosi, A; Vanzetti, L; Sorba, L; Bonanni, A; Cingolani, R; Lomascolo, M; Greco, ; D,
Buffer layer optimization for the growth of state of the art 3C-SiC/Si
2015 Bosi, Matteo; Attolini, Giovanni; Negri, Marco; Frigeri, Cesare; Buffagni, Elisa; Ferrari, Claudio; Rimoldi, Tiziano; Cristofolini, Luigi; Aversa, Lucrezia; Tatti, Roberta; Verucchi, Roberto
Carbon nanotubes grown by catalytic CVD on silicon based substrates for electronics applications
2007 Rizzoli, R.; Angelucci, R.; Guerri, S.; Parisini, A.; Veronese, G. P.; Vinciguerra, V.; Bevilacqua, M. F.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
1300°c annealing of 1×10<sup>20</sup> al<sup>+</sup> ion implanted 3C-SiC | 1-gen-2019 | Nipoti, Roberta; Canino, Mariaconcetta; Bonafè, Filippo; Torregrosa, Frank; Monnoye, Sylvain; Mank, Hugues; Zielinski, Marcin | |
1950°C annealing of Al<sup>+</sup> implanted 4H-SiC: Sheet resistance dependence on the annealing time | 1-gen-2016 | Nipoti, Roberta; Parisini, Antonella; Vantaggio, Salvatore; Alfieri, Giovanni; Carnera, Alberto; Centurioni, Emanuele; Elmi, Ivan; Grossner, Ulrike | |
2D simulation of under-mask penetration in 4H-SiC implanted with Al(+) ions | 1-gen-2011 | Lulli, Giorgio; Lulli, Giorgio; Nipoti, Roberta; Nipoti, Roberta | |
3 × 10<sup>18</sup> - 1 × 10<sup>19</sup> cm<sup>-3</sup> al<sup>+</sup> ion implanted 4h-sic: Annealing time effect | 1-gen-2020 | Nipoti, Roberta; Parisini, Antonella; Boldrini, Virginia; Vantaggio, Salvatore; Canino, Mariaconcetta; Sanmartin, Michele; Alfieri, Giovanni | |
3C-SiC heteroepitaxial growth on Inverted Silicon Pyramids (ISP) | 1-gen-2010 | D'Arrigo G.; Severino A.; Milazzo G.; Bongiorno C.; Piluso N.; Abbondanza G.; Mauceri M.; Condorelli G.; La Via F. | |
About the electrical activation of 1×10<sup>20</sup> cm<sup>-3</sup> ion implanted al in 4H-SiC at annealing temperatures in the range 1500 - 1950°C | 1-gen-2018 | Nipoti, Roberta; Carnera, Alberto; Alfieri, Giovanni; Kranz, Lukas | |
About the hole transport analysis in heavy doped p-type 4H-SiC(Al) | 1-gen-2015 | Parisini, A.; Nipoti, R. | |
Activation energy for the post implantation annealing of 10<sup>19</sup>cm<sup>-3</sup> and 10<sup>20</sup> cm<sup>-3</sup> ion implanted al in 4H SiC. | 1-gen-2019 | Nipoti, Roberta; Canino, Mariaconcetta; Sapienza, Sergio; Bellettato, Michele; Sozzi, Giovanna; Alfieri, Giovanni | |
Ag growth on 3C-SiC(001) c(2x2) C-terminated and c(4x2) Si-terminated surfaces | 1-gen-2002 | N. Rodriguez; M. D'Angelo; V Y Aristov; P. Soukiassian; A. Lescuras; C. Croti; M. Pedio; P. Perfetti | |
Al+ implanted 4H-SiC p(+)-i-n diodes: Evidence for post-implantation-annealing dependent defect activation | 1-gen-2014 | Grossner, U; Moscatelli, F; Nipoti, R | |
Al+ implanted 4H-SiC: improved electrical activation and ohmic contacts | 1-gen-2013 | R. Nipoti; A. Hallén; A. Parisini; F. Moscatelli; S. Vantaggio; | |
Al<sup>+</sup> ion implanted 4H-SiC vertical p<sup>+</sup>-i-n diodes: Processing dependence of leakage currents and OCVD carrier lifetimes | 1-gen-2017 | Nipoti, R.; Puzzanghera, M.; Sozzi, G. | |
Al<sup>+</sup> ion implanted on-axis <0001>semi-insulating 4H-SiC | 1-gen-2015 | Nipoti, Roberta; Parisini, Antonella; Carnera, Alberto; Albonetti, Cristiano; Vantaggio, Salvatore; Grossner, Ulrike | |
Analysis of the electrical activation of P+ implanted layers as a function of the heating rate of the annealing process | 1-gen-2007 | Canino, M; Giannazzo, F; Roccaforte, F; Poggi, A; Solmi, S; Raineri, V; Nipoti, R | |
Analysis of the Electron Traps at the 4H-SiC/SiO(2) Interface of a Gate Oxide Obtained by Wet Oxidation of a Nitrogen pre-Implanted Layer | 1-gen-2009 | Pintilie, I; Moscatelli, F; Nipoti, R; Poggi, A; Solmi, S; Svensson, ; B, G | |
Analytical prediction of the cross-over point in the temperature coefficient of the forward characteristics of 4H-SiC p<sup>+</sup>-i-n diodes | 1-gen-2015 | Di Benedetto, L.; Licciardo, G. D.; Bellone, S.; Nipoti, R. | |
Ar annealing at 1600 degrees C and 1650 degrees C of Al+ implanted p(+)/n 4H-SiC diodes: Analysis of the J-V characteristics versus annealing temperature | 1-gen-2005 | Bergamini F.; Moscatelli F.; Canino M.; Poggi A.; Nipoti R. | |
Band offset engineering of II-VI/III-V heterointerfaces | 1-gen-1995 | Franciosi, A; Vanzetti, L; Sorba, L; Bonanni, A; Cingolani, R; Lomascolo, M; Greco, ; D, | |
Buffer layer optimization for the growth of state of the art 3C-SiC/Si | 1-gen-2015 | Bosi, Matteo; Attolini, Giovanni; Negri, Marco; Frigeri, Cesare; Buffagni, Elisa; Ferrari, Claudio; Rimoldi, Tiziano; Cristofolini, Luigi; Aversa, Lucrezia; Tatti, Roberta; Verucchi, Roberto | |
Carbon nanotubes grown by catalytic CVD on silicon based substrates for electronics applications | 1-gen-2007 | Rizzoli, R.; Angelucci, R.; Guerri, S.; Parisini, A.; Veronese, G. P.; Vinciguerra, V.; Bevilacqua, M. F. |
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