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BOSCHERINI, FEDERICO

BOSCHERINI, FEDERICO  

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Risultati 1 - 20 di 56 (tempo di esecuzione: 0.054 secondi).
Titolo Data di pubblicazione Autore(i) File
A study of the growth of Lu2O3 on Si(001) by synchrotron radiation photoemission and transmission electron microscopy 1-gen-2007 Malvestuto, M; Pedio, M; Nannarone, S; Pavia, G; Scarel, G; Fanciulli, M; Boscherini, F
Ab initio analysis of the x-ray absorption spectrum of the myoglobin-carbon monoxide complex: Structure and vibrations 1-gen-2010 Veronesi, G.; Boschi, C. Degli Esposti; Ferrari, L.; Venturoli, G.; Boscherini, F.; Vila, F. D.; Rehr, J. J.
Absence of oxide formation at the Fe/MgO(001) interface 1-gen-2005 Luches, P; Benedetti, S; Liberati, M; Boscherini, F; Pronin, Ii; Valeri, S
Aliovalent Doping in Colloidal Quantum Dots and Its Manifestation on Their Optical Properties: Surface Attachment versus Structural Incorporation 1-gen-2015 Stavrinadis, Alexandros; S Pelli Cresi, Jacopo; D'Acapito, Francesco; Magén, César; Boscherini, Federico; Konstantatos, Gerasimos
Aliovalent Doping in Colloidal Quantum Dots and Its Manifestation on Their Optical Properties: Surface Attachment versus Structural Incorporation 1-gen-2016 Stavrinadis, Alexandros; Pelli Cresi, Jacopo S.; D'Acapito, Francesco; Magén, César; Boscherini, Federico; Boscherini, Federico; Konstantatos, Gerasimos; Konstantatos, Gerasimos
Anions relative location in the group-V sublattice of GaAsSbN/GaAs epilayers: XAFS measurements and simulations 1-gen-2007 Ciatto, G; Harmand, Jc; Glas, F; Largeau, L; Le Du, M; Boscherini, F; Malvestuto, M; Floreano, L; Glatzel, P; Mori, Ra
Applications of xafs to nanostructures and materials science 1-gen-2015 Boscherini F.
Atomic and electronic structure of ultrathin fluoride barrier layers at the oxide/Si interface 1-gen-2011 L Pasquali; M Montecchi; S Nannarone;F Boscherini
Atomic scale mechanism for the Ge-induced stabilization of the tetragonal, very high-kappa, phase of ZrO(2) 1-gen-2011 Boscherini, F; D'Acapito, F; F Galata, S; Tsoutsou, D; Dimoulas, A
B clustering in amorphous Si 1-gen-2008 De Salvador, D; Bisognin, G; Di Marino, M; Napolitani, E; Carnera, A; Mirabella, S; Pecora, E; Bruno, E; Priolo, F; Graoui, H; Foad, MA; Boscherini, F
Cation disorder and local structural distortions in AgxBi1-xS2 nanoparticles 1-gen-2020 Kesavan, Jk; D'Acapito, F; Scardi, P; Stavrinadis, A; Akgul, Mz; Burguesceballos, I; Konstantatos, G; Boscherini, F
Charge carrier dynamics and visible light photocatalysis in vanadium-doped TiO2 nanoparticles 1-gen-2018 Rossi, Giacomo; Pasquini, Luca; Catone, Daniele; Piccioni, Alberto; Patelli, Nicola; Paladini, Alessandra; Molinari, Alessandra; Caramori, Stefano; O'Keeffe, Patrick; Boscherini, Federico
Connections between local and macroscopic properties in solids: The case of N in III-V-N alloys 1-gen-2014 L. Amidani; G. Ciatto; F. Boscherini; Filippone F; G. Mattioli; P. Alippi; F. Bondino; A. Polimeni; M. Capizzi; A. Amore Bonapasta
Contraction, cation oxidation state and size effects in cerium oxide nanoparticles 1-gen-2017 Pelli Cresi J. S.; Spadaro M. C.; D'Addato S.; Valeri S.; Amidani L.; Boscherini F.; Bertoni G.; Deiana D.; Luches P.
Dose-dependent bonding environment of oxygen implanted in GaN 1-gen-2010 M.Katsikini; F. Boscherini; E.C. Paloura
Electronic properties of epitaxial cerium oxide films during controlled reduction and oxidation studied by resonant inelastic X-ray scattering 1-gen-2016 Gasperi, Gabriele; Amidani, Lucia; Benedetti, Francesco; Boscherini, Federico; Glatzel, Pieter; Valeri, Sergio; Luches, Paola
Element-specific channels for the photoexcitation of V-doped TiO2 nanoparticles 1-gen-2017 Rossi, Giacomo; Calizzi, Marco; Amidani, Lucia; Migliori, Andrea; Boscherini, Federico; Pasquini, Luca
Experimental evidence of B clustering in amorphous Si during ultrashallow junction formation 1-gen-2006 De Salvador, D; Bisognin, G; Di Marino, M; Napolitani, E; Carnera, A; Graoui, H; Foad, MA; Boscherini, F; Mirabella, S
Formation and dissolution of D-N complexes in dilute nitrides 1-gen-2007 Berti, M; Bisognin, G; De Salvador, D; Napolitani, E; Vangelista, S; Polimeni, A; Capizzi, M; Boscherini, F; Ciatto, G; Rubini, S; Martelli, F; Franciosi, A
Formation and incorporation of SiF4 molecules in F-implanted preamorphized Si 1-gen-2009 De Salvador D.; Bisognin G.; Napolitani E.; Mastromatteo M.; Baggio N.; Carnera A.; Boscherini F.; Impellizzeri G.; Mirabella S.; Boninelli S.; Priolo F.; Cristiano F.