CORSO, DOMENICO
CORSO, DOMENICO
Istituto per la Microelettronica e Microsistemi - IMM
Environmental management of Legionella in domestic water systems: consolidated and innovative approaches for disinfection methods and risk assessment
2021 Luigi Sciuto, Emanuele; Laganà, Pasqualina; Filice, Simona; Scalese, Silvia; Libertino, Sebania; Corso, Domenico; Faro, Giuseppina; Anna Coniglio, Maria
Biosensors in Monitoring Water Quality and Safety: An Example of a Miniaturizable Whole-Cell Based Sensor for Hg2+ Optical Detection in Water
2019 Sciuto, EMANUELE LUIGI; Coniglio Maria, Anna; Corso, Domenico; van der Meer Jan, Roelof; Acerbi, Fabio; Gola, Alberto; Libertino, Sebania
Effect of high temperature annealing (T > 1650 degrees C) on the morphological and electrical properties of p-type implanted 4H-SiC layers
2019 Spera, M; Corso, D; Di Franco, S; Greco, G; Severino, A; Fiorenza, P; Giannazzo, F; Roccaforte, F
Ohmic Contacts on p-Type Al-Implanted 4H-SiC Layers after Different Post-Implantation Annealings
2019 Spera, Monia; Greco, Giuseppe; Corso, Domenico; Di Franco, Salvatore; Severino, Andrea; Messina, Angelo Alberto; Giannazzo, Filippo; Roccaforte, Fabrizio
Modification of the sheet resistance under Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructures
2018 M. Spera ,,; C. Miccoli ; R. Lo Nigro ; C. Bongiorno ; D. Corso ; S. Di Franco ; F. Iucolano ; F. Roccaforte ; G. Greco
Metal/p-gan contacts on AlGaN/GaN heterostructures for normally-off HEMTs
2016 Greco, G; Iucolano, F; Giannazzo, F; DI FRANCO, Salvatore; Corso, D; Smecca, E; Alberti, A; Patti, A; Roccaforte, F
Silicon Photomultiplier Device Architecture with Dark Current Improved to the Ultimate Physical Limit
2013 Pagano, R; Valvo, G; Sanfilippo, D; Libertino, S; Corso, D; Fallica, Pg; Lombardo, S
Silicon Photomultiplier: Technology improvement and performance
2013 Pagano, R; Libertino, S; Corso, D; Lombardo, S; Valvo, G; Sanfilippo, D; Condorelli, G; Mazzillo, M; Apiana, ; Carbone, B; Fallica, G
Dark Current in Silicon Photomultiplier Pixels: Data and Model
2012 Pagano, R; Corso, D; Lombardo, S; Valvo, G; Sanfilippo, Dn; Fallica, G; Libertino, S
Ionizing radiation effects on Non Volatile Read Only Memory cells
2012 S. Libertino; D. Corso; M. Lisiansky; Y. Roizin; F. Palumbo; F. Principato; C. Pace; P. Finocchiaro;S. Lombardo
Threshold Voltage Variability of NROM Memories After Exposure to Ionizing Radiation
2012 Corso, D; Libertino, S; Lisiansky, M; Roizin, Y; Palumbo, F; Principato, F; Pace, C; Finocchiaro, P; Lombardo, S
Multiple gate NVM cells with improved Fowler-Nordheim tunneling program and erase performances
2010 Gerardi C; Tripiciano E; Cina G; Lombardo S; Garozzo C; Corso D; Betro G; Pace C; Crupi F
Radiation effects in nitride read-only memories
2010 Libertino, S; Corso, D; Mure, G; Marino, A; Palumbo, F; Principato, F; Cannella, G; Schillaci, T; Giarusso, S; Celi, F; Lisiansky, M; Roizin, Y; Lombardo, S
Radiation Tolerance of NROM Embedded Products
2010 Lisiansky, M; Cassuto, G; Roizin, Y; Corso, D; Libertino, S; Marino, A; Lombardo, Sa; Crupi, I; Pace, C; Crupi, F; Fuks, D; Kiv, A; Della Sala, E; Capuano, G; Palumbo, F
Electron programing and hole erasing in silicon nanocrystal Flash memories with fin field-effect transistor architecture
2008 Corso D.; Mure G.; Lombardo S.; Cina G.; Tripiciano E.; Gerardi C.; Rimini E.
Radiation Effects on Programmed NROM Cells
2008 D. Corso; A. Palermo; F. Palumbo; S. Libertino; S. Lombardo; M. Lisiansky; Y. Roizin
Advantages of the FinFET architecture in SONOS and Nanocrystal memory devices
2007 Lombardo, S; Gerardi, C; Breuil, L; Jahan, C; Perniola, L; Cina, G; Corso, D; Tripiciano, E; Ancarani, V; Iannaccone, G; Iacono, G; Bongiorno, C; Garozzo, C; Barbera, P; Nowak, E; Puglisi, R; Costa, G; Coccorese, C; Vecchio, M; Rimini, E; Van Houdt, J; De Salvo, B; Melanotte, M
Experimental study of single-electron phenomena in silicon nanocrystal memories
2007 Pace C; Crupi F; Corso D; Lombardo S
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage
2007 Corso D; Aurite S; Sciacca E; Naso D; Lombardo S; Santangelo A; Nicotra MC; Cascino S
Single-electron program/erase tunnel events in nanocrystal memories
2007 Corso, D; Pace, C; Crupi, F; Lombardo, S
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Environmental management of Legionella in domestic water systems: consolidated and innovative approaches for disinfection methods and risk assessment | 1-gen-2021 | Luigi Sciuto, Emanuele; Laganà, Pasqualina; Filice, Simona; Scalese, Silvia; Libertino, Sebania; Corso, Domenico; Faro, Giuseppina; Anna Coniglio, Maria | |
| Biosensors in Monitoring Water Quality and Safety: An Example of a Miniaturizable Whole-Cell Based Sensor for Hg2+ Optical Detection in Water | 1-gen-2019 | Sciuto, EMANUELE LUIGI; Coniglio Maria, Anna; Corso, Domenico; van der Meer Jan, Roelof; Acerbi, Fabio; Gola, Alberto; Libertino, Sebania | |
| Effect of high temperature annealing (T > 1650 degrees C) on the morphological and electrical properties of p-type implanted 4H-SiC layers | 1-gen-2019 | Spera, M; Corso, D; Di Franco, S; Greco, G; Severino, A; Fiorenza, P; Giannazzo, F; Roccaforte, F | |
| Ohmic Contacts on p-Type Al-Implanted 4H-SiC Layers after Different Post-Implantation Annealings | 1-gen-2019 | Spera, Monia; Greco, Giuseppe; Corso, Domenico; Di Franco, Salvatore; Severino, Andrea; Messina, Angelo Alberto; Giannazzo, Filippo; Roccaforte, Fabrizio | |
| Modification of the sheet resistance under Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructures | 1-gen-2018 | M. Spera ,,; C. Miccoli ; R. Lo Nigro ; C. Bongiorno ; D. Corso ; S. Di Franco ; F. Iucolano ; F. Roccaforte ; G. Greco | |
| Metal/p-gan contacts on AlGaN/GaN heterostructures for normally-off HEMTs | 1-gen-2016 | Greco, G; Iucolano, F; Giannazzo, F; DI FRANCO, Salvatore; Corso, D; Smecca, E; Alberti, A; Patti, A; Roccaforte, F | |
| Silicon Photomultiplier Device Architecture with Dark Current Improved to the Ultimate Physical Limit | 1-gen-2013 | Pagano, R; Valvo, G; Sanfilippo, D; Libertino, S; Corso, D; Fallica, Pg; Lombardo, S | |
| Silicon Photomultiplier: Technology improvement and performance | 1-gen-2013 | Pagano, R; Libertino, S; Corso, D; Lombardo, S; Valvo, G; Sanfilippo, D; Condorelli, G; Mazzillo, M; Apiana, ; Carbone, B; Fallica, G | |
| Dark Current in Silicon Photomultiplier Pixels: Data and Model | 1-gen-2012 | Pagano, R; Corso, D; Lombardo, S; Valvo, G; Sanfilippo, Dn; Fallica, G; Libertino, S | |
| Ionizing radiation effects on Non Volatile Read Only Memory cells | 1-gen-2012 | S. Libertino; D. Corso; M. Lisiansky; Y. Roizin; F. Palumbo; F. Principato; C. Pace; P. Finocchiaro;S. Lombardo | |
| Threshold Voltage Variability of NROM Memories After Exposure to Ionizing Radiation | 1-gen-2012 | Corso, D; Libertino, S; Lisiansky, M; Roizin, Y; Palumbo, F; Principato, F; Pace, C; Finocchiaro, P; Lombardo, S | |
| Multiple gate NVM cells with improved Fowler-Nordheim tunneling program and erase performances | 1-gen-2010 | Gerardi C; Tripiciano E; Cina G; Lombardo S; Garozzo C; Corso D; Betro G; Pace C; Crupi F | |
| Radiation effects in nitride read-only memories | 1-gen-2010 | Libertino, S; Corso, D; Mure, G; Marino, A; Palumbo, F; Principato, F; Cannella, G; Schillaci, T; Giarusso, S; Celi, F; Lisiansky, M; Roizin, Y; Lombardo, S | |
| Radiation Tolerance of NROM Embedded Products | 1-gen-2010 | Lisiansky, M; Cassuto, G; Roizin, Y; Corso, D; Libertino, S; Marino, A; Lombardo, Sa; Crupi, I; Pace, C; Crupi, F; Fuks, D; Kiv, A; Della Sala, E; Capuano, G; Palumbo, F | |
| Electron programing and hole erasing in silicon nanocrystal Flash memories with fin field-effect transistor architecture | 1-gen-2008 | Corso D.; Mure G.; Lombardo S.; Cina G.; Tripiciano E.; Gerardi C.; Rimini E. | |
| Radiation Effects on Programmed NROM Cells | 1-gen-2008 | D. Corso; A. Palermo; F. Palumbo; S. Libertino; S. Lombardo; M. Lisiansky; Y. Roizin | |
| Advantages of the FinFET architecture in SONOS and Nanocrystal memory devices | 1-gen-2007 | Lombardo, S; Gerardi, C; Breuil, L; Jahan, C; Perniola, L; Cina, G; Corso, D; Tripiciano, E; Ancarani, V; Iannaccone, G; Iacono, G; Bongiorno, C; Garozzo, C; Barbera, P; Nowak, E; Puglisi, R; Costa, G; Coccorese, C; Vecchio, M; Rimini, E; Van Houdt, J; De Salvo, B; Melanotte, M | |
| Experimental study of single-electron phenomena in silicon nanocrystal memories | 1-gen-2007 | Pace C; Crupi F; Corso D; Lombardo S | |
| Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage | 1-gen-2007 | Corso D; Aurite S; Sciacca E; Naso D; Lombardo S; Santangelo A; Nicotra MC; Cascino S | |
| Single-electron program/erase tunnel events in nanocrystal memories | 1-gen-2007 | Corso, D; Pace, C; Crupi, F; Lombardo, S |