ITALIA, MARKUS

ITALIA, MARKUS  

Istituto per la Microelettronica e Microsistemi - IMM  

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Risultati 1 - 20 di 34 (tempo di esecuzione: 0.044 secondi).
Titolo Data di pubblicazione Autore(i) File
A comprehensive study on the physicochemical and electrical properties of Si doped with the molecular doping method 1-gen-2015 Puglisi Rosaria, A; Caccamo, Sebastiano; D'Urso, Luisa; Fisichella, Gabriele; Giannazzo, Filippo; Italia, Markus; LA MAGNA, Antonino
Advanced organic molecular doping applied to Si: influence of the processing conditions on the electrical properties 1-gen-2018 Caccamo, Sebastiano; Grazia Grimaldi, Maria; Italia, Markus; LA MAGNA, Antonino; Mannino, Giovanni; A Puglisi, Rosaria
Boron distribution in silicon after excimer laser annealing with multiple pulses 1-gen-2005 Monakhov, Ev; Svensson, Bg; Linnarsson, Mk; La Magna, A; Italia, M; Privitera, V; Fortunato, G; Cuscuna, M; Mariucci, L
Boron distribution in silicon after multiple pulse excimer laser annealing 1-gen-2005 Monakhov E.V.; Svensson B.G.; Linnarsson M.K.; La Magna A.; Italia M.; Privitera V.; Fortunato G.; Cuscuna M.; Mariucci L.
Bow in 6 inch high-quality off-axis (111) 3C-SiC films 1-gen-2010 Severino A; Camarda M; Piluso N; Italia M; Condorelli G; Mauceri M; Abbondanza G; La Via F
Diffusion and electrical activation of indium in silicon 1-gen-2003 Scalese, S; Italia, M; La Magna, A; Mannino, G; Privitera, V; Bersani, M; Giubertoni, D; Barozzi, M; Solmi, S; Pichler, P
Dopant behaviour and damage annealing in silicon implanted with 1 kev arsenic 1-gen-2002 Whelan, S; Privitera, V; Mannino, G; Italia, M; Bongiorno, C; Napolitani, E; Collart, Ejh; Van Den Berg, Ja
Dopant redistribution and electrical activation in silicon following ultra-low energy boron implantation and excimer laser annealing. 1-gen-2003 Whelan, S; La Magna, A; Privitera, V; Mannino, G; Italia, M; Bongiorno, C; Fortunato, G; Mariucci, L
Electrical activation of B and As implants in Silicon On Insulator (SOI) wafers 1-gen-2004 Ottaviano, L; Italia, M; Mannino, G; Privitera, V; Herden, M; Feudel, T
Electrical activation of ultralow energy As implants in Si 1-gen-2001 Whelan S; Privitera V; Mannino G; Italia M; Bongiorno C; La Magna A; Napolitani E
Electrical activation phenomena induced by excimer laser annealing in B-implanted silicon 1-gen-2004 Fortunato, G; Mariucci, L; La Magna, A; Alippi, P; Italia, M; Privitera, V; Svensson, B; Monakhov, E
Excimer laser annealing of B and BF2 implanted Si 1-gen-2005 Monakhov, Ev; Svensson, Bg; Linnarsson, Mk; La Magna, A; Italia, M; Privitera, V; Fortunato, G; Cuscuna, M; Mariucci, L
Excimer Laser Annealing of Ion-Implanted Silicon: Dopant Activation, Diffusion and Defect Formation 1-gen-2007 Monakhov, Ev; Svensson, Bg; La Magna, A; Alippi, P; Italia, M; Privitera, V; Fortunato, G; Mariucci, L; Tumisto, F; Kuitunen, K
Experimental determination of the local geometry around In and In-C complexes in Si 1-gen-2006 D'Acapito, F; Shimizu, Y; Scalese, S; Italia, M; Alippi, P; Grasso, S
Heterogeneous growth of continuous ZIF-8 films on low-temperature amorphous silicon 1-gen-2019 Monforte, Francesca; Monforte, Francesca; Mannino, Giovanni; Alberti, Alessandra; Smecca, Emanuele; Italia, Markus; Motta, Alessandro; Tudisco, Cristina; Condorelli, Guglielmo G.
High-quality 6 inch (111) 3C-SiC films grown on off-axis (111) Si substrates 1-gen-2010 Severino A; Bongiorno C; Piluso N; Italia M; Camarda M; Mauceri M; Condorelli G; Di Stefano MA; Cafra B; La Magna A; La Via F
Investigation of the indium-boron interaction in silicon 1-gen-2006 Scalese S; Grasso S; Italia M; Privitera V; Christensen JS; Svensson BG
Kinetic Monte Carlo simulation of dopant-defect systems under submicrosecond laser thermal processes 1-gen-2012 Fisicaro G; Pelaz L; Lopez P; Italia M; Huet K; Venturini J; La Magna A
Laser annealing in Si and Ge: Anomalous physical aspects and modeling approaches 1-gen-2017 Lombardo, S F; Boninelli, S; Cristiano, F; Fisicaro, G; Fortunato, G; Grimaldi, M G; Impellizzeri, G; Italia, M; Marino, A; Milazzo, R; Napolitani, E; Privitera, V; La Magna, A
Low Stress Heteroepitaxial 3C-SiC Films Characterized by Microstructure Fabrication and Finite Elements Analysis 1-gen-2010 Anzalone, R; Camarda, M; Locke, C; Alquier, D; Severino, A; Italia, M; Rodilosso, D; Tringali, C; La Magna, A; Foti, G; Saddow, Se; La Via, F; D'Arrigo, G