CNR Institutional Research Information System

MERLI, PIER GIORGIO
 Distribuzione geografica
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Continente #
AS - Asia 967
NA - Nord America 708
EU - Europa 247
SA - Sud America 182
AF - Africa 10
Totale 2.114
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Nazione #
US - Stati Uniti d'America 682
SG - Singapore 504
BR - Brasile 157
CN - Cina 155
VN - Vietnam 113
HK - Hong Kong 88
NL - Olanda 63
FR - Francia 54
IT - Italia 45
KR - Corea 23
CA - Canada 19
GB - Regno Unito 19
DE - Germania 17
IN - India 16
JP - Giappone 15
AR - Argentina 10
BD - Bangladesh 9
ES - Italia 8
ID - Indonesia 8
TR - Turchia 7
EC - Ecuador 6
FI - Finlandia 6
IQ - Iraq 6
PL - Polonia 6
BE - Belgio 5
ZA - Sudafrica 5
AE - Emirati Arabi Uniti 4
CO - Colombia 4
NP - Nepal 4
SE - Svezia 4
UA - Ucraina 4
BG - Bulgaria 2
EG - Egitto 2
IL - Israele 2
JM - Giamaica 2
JO - Giordania 2
LV - Lettonia 2
MX - Messico 2
RU - Federazione Russa 2
SA - Arabia Saudita 2
AL - Albania 1
AT - Austria 1
AZ - Azerbaigian 1
BA - Bosnia-Erzegovina 1
BH - Bahrain 1
BJ - Benin 1
CH - Svizzera 1
CL - Cile 1
CM - Camerun 1
CR - Costa Rica 1
CZ - Repubblica Ceca 1
DK - Danimarca 1
EE - Estonia 1
HU - Ungheria 1
IE - Irlanda 1
KZ - Kazakistan 1
LK - Sri Lanka 1
MD - Moldavia 1
MN - Mongolia 1
NG - Nigeria 1
OM - Oman 1
PE - Perù 1
PK - Pakistan 1
PY - Paraguay 1
SV - El Salvador 1
TJ - Tagikistan 1
TT - Trinidad e Tobago 1
TW - Taiwan 1
UY - Uruguay 1
VE - Venezuela 1
Totale 2.114
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Città #
Santa Clara 328
Singapore 304
Hong Kong 86
Lauterbourg 49
San Jose 48
Hefei 47
Ashburn 32
Beijing 32
Hanoi 32
Ho Chi Minh City 32
Los Angeles 24
Seoul 23
Buffalo 17
São Paulo 16
Frankfurt am Main 13
Tokyo 11
Toronto 10
Dallas 9
New York 8
London 7
Rio de Janeiro 6
Rome 6
Belo Horizonte 5
Brooklyn 5
Brussels 5
Orem 5
Warsaw 5
Denver 4
Istanbul 4
Montreal 4
Ninh Bình 4
Quito 4
Stockholm 4
Amsterdam 3
Ascoli Piceno 3
Atlanta 3
Chennai 3
Curitiba 3
Da Nang 3
Guangzhou 3
Haiphong 3
Helsinki 3
Houston 3
Imperatriz 3
Minamishinagawa 3
Plainfield 3
Quận Một 3
Sacramento 3
San Francisco 3
Thái Bình 3
Thái Nguyên 3
Turku 3
Vĩnh Tường 3
Amman 2
Ankara 2
Baghdad 2
Barra Mansa 2
Bengaluru 2
Biên Hòa 2
Bologna 2
Boston 2
Bình An 2
Bình Dương Province 2
Bắc Ninh 2
Cairo 2
Camerino 2
Campina Grande 2
Campinas 2
Chandler 2
Chicago 2
Chongqing 2
College Station 2
Colombo 2
Copperas Cove 2
Daytona Beach 2
Dhaka 2
Diadema 2
Dubai 2
Eau Claire 2
Egham 2
El Paso 2
Greenville 2
Hollywood 2
Hải Dương 2
Icapuí 2
Johannesburg 2
Kingston 2
Kyiv 2
Las Vegas 2
Miami 2
Middletown 2
Milan 2
Modena 2
Mumbai 2
Naples 2
New Delhi 2
New Orleans 2
Nova Friburgo 2
Nuremberg 2
Osasco 2
Totale 1.343
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Nome #
Electron microscopy of nanostructures: instrumental and methodological advances 72
Scanning electron microscopy of dopant distribution in semiconductors 62
Optimization of the performance of CVD diamond electron multipliers 61
RAPID ISOTHERMAL ANNEALING OF ION IMPLANTED SILICON DEVICES BY UNIFORM LARGE AREA IRRADIATION WITH A NEW ELECTRON BEAM SYSTEM. 51
Conductive Sub-micrometric Wires of Platinum-Carbonyl Clusters Fabricated by Soft-lithography 50
Electron Holography of Size- controlled Nanoclusters 50
Microscopia elettronica a scansione con elettroni secondari, retrodiffusi e trasmessi 47
Dopant regions imaging in scanning electron microscopy 47
Electron Holography of Size- controlled Nanoclusters 46
Contrast and resolution versus specimen thickness in low energy scanning transmission electron microscopy 46
Dispositivo rivelatore per microscopio elettronico 45
Resolution of semiconductor multilayers using backscattered electrons in scanning electron microscopy 44
Interference Electron Microscopy of reverse biased p-n junction 44
Thermodynamic properties and optical characterization of metal nanoparticles in dielectric matrix 43
Characterization of nanowires of semiconducting metal-oxides and their functional properties 43
Si Ultra Shallow Junctions Dopant Profiling with ADF-STEM 42
Dopant profiling on ultrashallow junctions in Si with ADF-STEM 42
Synthesis of small gold nanoparticles: Au(I) disproportionation catalyzed by a persulfurated coronene dentrimer 42
Detection device for Electron Microscope 41
Electrical and holographic characterization of gold catalyzed titania-based layers 41
Quantitative determination of the dopant distribution in Si ultrashallow junctions by tilted sample annular dark field scanning transmission electron microscopy 41
Interference Electron Microscopy of reverse biased p-n junction 41
On the resolution of semiconductor multilayers with a scanning electron microscope 39
Characterization of nanowires of semiconducting metal-oxides and their functional properties 38
Stationary Secondary Electron Emission From CVD Diamond Films 36
Comparison between electron-beam and furnace rapid isothermal anneals of phosphorus-implanted solar cells 35
Effects of Ta/Nb-doping on titania-based thin films for gas-sensing 35
Secondary electron emission from diamond: Physical modeling and application to scanning electron microscopy 34
Scanning electron microscopy of thinned specimens: From multilayers to biological samples 33
Electron microscope calibration for the Lorentz mode 33
About the role of boundary conditions on compositional imaging with a scanning electron microscope 32
Scanning electron microscopy of thinned multilayers and biological samples 32
Comparison of spatial resolutions obtained with different signal components in scanning electron microscopy 32
Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers 32
Electron spectroscopic imaging of dopant precipitation and segregation in silicon 32
Si Ultra Shallow Junctions Dopant Profiling with ADF-STEM 31
Spatial resolution and energy filtering of backscattered electron images in scanning electron microscopy 30
Investigation of dopant profiles in nanosized materials by scanning transmission electron microscopy 30
Fundamental properties of lead and tin nanocrystals in a dielectric matrix 29
Structure and local dipole of Si interface layers in AlAs-GaAs heterostructures 29
Influence of charged oxide layers on TEM imaging of reverse-biased p-n junctions 29
Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers 29
Radiation damage evolution and its relation with dopant distribution during self-annealing implantation of As in silicon 28
The double-slit experiment with single electrons 28
Effects of beam-specimen interaction on the observation of reverse-biased p-n junctions by electron interferometry 28
Images of dopant profiles in low-energy scanning transmission electron microscopy 27
SELF-ANNEALED ION-IMPLANTED SOLAR-CELLS 26
Low-energy STEM of multilayers and dopant profiles 26
Tridimensional characterization of voids in self-annealed implanted silicon using electron holography 26
New approach to study melting processes in metal nanoparticles: capacitance measurements 25
The effects of boundary conditions on dopant region imaging in scanning electron microscopy 25
Electron holography study of voids in self-annealed implanted silicon 25
Off-axis electron holography of nearly faceted voids in del-annealed implanted silicon 23
Scanning and conventional transmission electron microscopy of semiconducting superlattices 22
Dopant profile investigation in low-energy scanning transmission electron microscopy 22
Insight into the premelting and melting processes of metal nanoparticles through capacitance measurements 21
Phase transitions in gallium nanodroplets detected by dielectric spectroscopy 19
Off-axis electron holography of nearly-spherical faceted voids in self-annealed implanted silicon 19
Low Energy STEM of Multi-layers and Dopant Profiles 18
The effects of boundary conditions on dopant region imaging in scanning electron microscopy 15
Totale 2.114
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Categoria #
all - tutte 7.290
article - articoli 5.529
book - libri 153
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 12.972
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2023/202420 0 0 0 0 0 0 0 0 1 0 17 2
2024/2025981 1 1 72 33 263 92 3 53 11 58 204 190
2025/20261.061 36 49 83 162 268 33 185 72 54 65 36 18
2026/202752 52 0 0 0 0 0 0 0 0 0 0 0
Totale 2.114