MERLI, PIER GIORGIO
 Distribuzione geografica
Continente #
AS - Asia 964
NA - Nord America 646
EU - Europa 237
SA - Sud America 182
AF - Africa 10
Totale 2.039
Nazione #
US - Stati Uniti d'America 623
SG - Singapore 503
BR - Brasile 157
CN - Cina 155
VN - Vietnam 113
HK - Hong Kong 88
NL - Olanda 63
FR - Francia 54
IT - Italia 35
KR - Corea 23
GB - Regno Unito 19
CA - Canada 17
DE - Germania 17
IN - India 16
JP - Giappone 15
AR - Argentina 10
BD - Bangladesh 8
ES - Italia 8
ID - Indonesia 8
TR - Turchia 7
EC - Ecuador 6
FI - Finlandia 6
IQ - Iraq 6
PL - Polonia 6
BE - Belgio 5
ZA - Sudafrica 5
AE - Emirati Arabi Uniti 4
CO - Colombia 4
SE - Svezia 4
UA - Ucraina 4
NP - Nepal 3
BG - Bulgaria 2
EG - Egitto 2
IL - Israele 2
JM - Giamaica 2
JO - Giordania 2
LV - Lettonia 2
MX - Messico 2
RU - Federazione Russa 2
SA - Arabia Saudita 2
AL - Albania 1
AT - Austria 1
AZ - Azerbaigian 1
BA - Bosnia-Erzegovina 1
BH - Bahrain 1
BJ - Benin 1
CH - Svizzera 1
CL - Cile 1
CM - Camerun 1
CR - Costa Rica 1
CZ - Repubblica Ceca 1
DK - Danimarca 1
EE - Estonia 1
HU - Ungheria 1
IE - Irlanda 1
KZ - Kazakistan 1
LK - Sri Lanka 1
MD - Moldavia 1
MN - Mongolia 1
NG - Nigeria 1
OM - Oman 1
PE - Perù 1
PK - Pakistan 1
PY - Paraguay 1
TJ - Tagikistan 1
TT - Trinidad e Tobago 1
TW - Taiwan 1
UY - Uruguay 1
VE - Venezuela 1
Totale 2.039
Città #
Santa Clara 327
Singapore 304
Hong Kong 86
Lauterbourg 49
San Jose 48
Hefei 47
Beijing 32
Hanoi 32
Ho Chi Minh City 32
Ashburn 26
Seoul 23
Los Angeles 22
Buffalo 16
São Paulo 16
Frankfurt am Main 13
Tokyo 11
Toronto 10
Dallas 9
New York 8
London 7
Rio de Janeiro 6
Belo Horizonte 5
Brooklyn 5
Brussels 5
Orem 5
Rome 5
Warsaw 5
Denver 4
Istanbul 4
Montreal 4
Ninh Bình 4
Quito 4
Stockholm 4
Amsterdam 3
Chennai 3
Curitiba 3
Da Nang 3
Guangzhou 3
Haiphong 3
Helsinki 3
Imperatriz 3
Minamishinagawa 3
Quận Một 3
San Francisco 3
Thái Bình 3
Thái Nguyên 3
Turku 3
Vĩnh Tường 3
Amman 2
Ankara 2
Atlanta 2
Baghdad 2
Barra Mansa 2
Bengaluru 2
Biên Hòa 2
Bologna 2
Boston 2
Bình An 2
Bình Dương Province 2
Bắc Ninh 2
Cairo 2
Campina Grande 2
Campinas 2
Chongqing 2
Colombo 2
Dhaka 2
Diadema 2
Dubai 2
Egham 2
Hải Dương 2
Icapuí 2
Johannesburg 2
Kingston 2
Kyiv 2
Milan 2
Modena 2
Mumbai 2
Naples 2
New Delhi 2
Nova Friburgo 2
Nuremberg 2
Osasco 2
Parma 2
Piracicaba 2
Porto Alegre 2
Riga 2
Santo André 2
Savigliano 2
Sorocaba 2
Teófilo Otoni 2
The Dalles 2
Verona 2
Vĩnh Long 2
Abu Dhabi 1
Albuquerque 1
Alcalá de Henares 1
Alegrete 1
Alto Araguaia 1
Anderson 1
Arapiraca 1
Totale 1.320
Nome #
Electron microscopy of nanostructures: instrumental and methodological advances 71
Scanning electron microscopy of dopant distribution in semiconductors 62
Optimization of the performance of CVD diamond electron multipliers 51
RAPID ISOTHERMAL ANNEALING OF ION IMPLANTED SILICON DEVICES BY UNIFORM LARGE AREA IRRADIATION WITH A NEW ELECTRON BEAM SYSTEM. 50
Conductive Sub-micrometric Wires of Platinum-Carbonyl Clusters Fabricated by Soft-lithography 48
Electron Holography of Size- controlled Nanoclusters 48
Microscopia elettronica a scansione con elettroni secondari, retrodiffusi e trasmessi 45
Electron Holography of Size- controlled Nanoclusters 44
Dopant regions imaging in scanning electron microscopy 44
Contrast and resolution versus specimen thickness in low energy scanning transmission electron microscopy 43
Characterization of nanowires of semiconducting metal-oxides and their functional properties 42
Si Ultra Shallow Junctions Dopant Profiling with ADF-STEM 42
Resolution of semiconductor multilayers using backscattered electrons in scanning electron microscopy 42
Thermodynamic properties and optical characterization of metal nanoparticles in dielectric matrix 41
Dispositivo rivelatore per microscopio elettronico 41
Interference Electron Microscopy of reverse biased p-n junction 41
Dopant profiling on ultrashallow junctions in Si with ADF-STEM 40
Interference Electron Microscopy of reverse biased p-n junction 40
Synthesis of small gold nanoparticles: Au(I) disproportionation catalyzed by a persulfurated coronene dentrimer 40
Detection device for Electron Microscope 39
On the resolution of semiconductor multilayers with a scanning electron microscope 39
Quantitative determination of the dopant distribution in Si ultrashallow junctions by tilted sample annular dark field scanning transmission electron microscopy 38
Electrical and holographic characterization of gold catalyzed titania-based layers 36
Characterization of nanowires of semiconducting metal-oxides and their functional properties 35
Comparison between electron-beam and furnace rapid isothermal anneals of phosphorus-implanted solar cells 35
Effects of Ta/Nb-doping on titania-based thin films for gas-sensing 35
Secondary electron emission from diamond: Physical modeling and application to scanning electron microscopy 34
Stationary Secondary Electron Emission From CVD Diamond Films 34
Electron microscope calibration for the Lorentz mode 33
About the role of boundary conditions on compositional imaging with a scanning electron microscope 32
Scanning electron microscopy of thinned specimens: From multilayers to biological samples 32
Comparison of spatial resolutions obtained with different signal components in scanning electron microscopy 32
Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers 32
Scanning electron microscopy of thinned multilayers and biological samples 31
Electron spectroscopic imaging of dopant precipitation and segregation in silicon 31
Spatial resolution and energy filtering of backscattered electron images in scanning electron microscopy 30
Fundamental properties of lead and tin nanocrystals in a dielectric matrix 29
Structure and local dipole of Si interface layers in AlAs-GaAs heterostructures 29
Influence of charged oxide layers on TEM imaging of reverse-biased p-n junctions 29
Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers 29
Si Ultra Shallow Junctions Dopant Profiling with ADF-STEM 29
Radiation damage evolution and its relation with dopant distribution during self-annealing implantation of As in silicon 28
Effects of beam-specimen interaction on the observation of reverse-biased p-n junctions by electron interferometry 28
Investigation of dopant profiles in nanosized materials by scanning transmission electron microscopy 27
SELF-ANNEALED ION-IMPLANTED SOLAR-CELLS 26
Low-energy STEM of multilayers and dopant profiles 26
The double-slit experiment with single electrons 26
Images of dopant profiles in low-energy scanning transmission electron microscopy 25
The effects of boundary conditions on dopant region imaging in scanning electron microscopy 25
Electron holography study of voids in self-annealed implanted silicon 25
Tridimensional characterization of voids in self-annealed implanted silicon using electron holography 25
New approach to study melting processes in metal nanoparticles: capacitance measurements 23
Off-axis electron holography of nearly faceted voids in del-annealed implanted silicon 23
Scanning and conventional transmission electron microscopy of semiconducting superlattices 22
Dopant profile investigation in low-energy scanning transmission electron microscopy 22
Insight into the premelting and melting processes of metal nanoparticles through capacitance measurements 20
Phase transitions in gallium nanodroplets detected by dielectric spectroscopy 19
Off-axis electron holography of nearly-spherical faceted voids in self-annealed implanted silicon 19
Low Energy STEM of Multi-layers and Dopant Profiles 18
The effects of boundary conditions on dopant region imaging in scanning electron microscopy 14
Totale 2.039
Categoria #
all - tutte 6.556
article - articoli 4.936
book - libri 143
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 11.635


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2023/202420 0 0 0 0 0 0 0 0 1 0 17 2
2024/2025981 1 1 72 33 263 92 3 53 11 58 204 190
2025/20261.038 36 49 83 162 268 33 185 72 54 65 31 0
Totale 2.039