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FERRI, MATTEO

FERRI, MATTEO  

Istituto per la Microelettronica e Microsistemi - IMM  

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Risultati 1 - 20 di 29 (tempo di esecuzione: 0.019 secondi).
Titolo Data di pubblicazione Autore(i) File
A packaging technique for silicon MEMS strain sensors on steel 1-gen-2008 Ferri, M; Cristiani, S; Kobayashi, Y; Soga, K; Roncaglia, A
Arsenic uphill diffusion during shallow junction formation 1-gen-2006 Ferri, M; Solmi, S; Parisini, A; Bersani, M; Giubertoni, D; Barozzi, M
beta-SiC NWs grown on patterned and MEMS silicon substrates 1-gen-2011 Watts, BERNARD ENRICO; Bernard Enrico, E; Attolini, Giovanni; Attolini, Giovanni; Rossi, Francesca; Rossi, Francesca; Bosi, Matteo; Bosi, Matteo; Salviati, Giancarlo; Salviati, Giancarlo; Mancarella, Fulvio; Mancarella, Fulvio; Ferri, Matteo; Bosi, Matteo; Roncaglia, Alberto; Roncaglia, Alberto; Poggi, Antonella; Poggi, Antonella
Carbon-cap for Ohmic Contacts on Ion Implanted 4H-SiC 1-gen-2010 Nipoti R; Mancarella F; Moscatelli F; Rizzoli R; Zampolli S; Ferri M
Crossbar architecture for tera scale integration 1-gen-2011 Cerofolini GF; Ferri M; Romano E; Suriano F; Veronese GP; Solmi S; Narducci D
Damage and recovery in arsenic doped silicon after high energy Si+ implantation 1-gen-2004 Solmi, S; Ferri, M; Nobili, D; Bianconi, M
Damage and recovery in boron doped silicon on insulator layers after high energy Si+ implantation 1-gen-2006 Ferri, M; Solmi, S; Nobili, D; Armigliato, A
Damage and recovery in doped SOI layers after high energy implantation 1-gen-2004 Ferri, M; Solmi, S; Armigliato, A; Bianconi, M; Lulli, G; Nobili, D
Damage recovery in boron doped silicon on insulator layers after high energy Si+ implantation 1-gen-2006 M. Ferri; S. Solmi; D. Nobili; A. Armigliato
Epitaxial growth, mechanical and electrical properties of SiC/Si and SiC/poly-Si 1-gen-2012 Bosi, M; Attolini, G; Watts, Be; Roncaglia, A; Poggi, A; Mancarella, F; Moscatelli, F; Belsito, L; Ferri, M
Fabrication and packaging techniques for the application of MEMS strain sensors to wireless crack monitoring in ageing civil infrastructures 1-gen-2010 Ferri, M; Mancarella, F; Seshia, A; Ransley, J; Soga, K; Zalesky, J; Roncaglia, A
Fabrication of DETF sensors in SOI technology with submicron air gaps using a maskless line narrowing technique 1-gen-2008 Ferri M; Mancarella F; Ransley J; Yan J; Seshia A;Roncaglia A
Fabrication of fiber-optic broadband ultrasound emitters by micro-opto-mechanical technology 1-gen-2014 Belsito, L; Vannacci, E; Mancarella, F; Ferri, M; Veronese, G; Biagi, E; Roncaglia, Alberto; A,
Fabrication of high-resolution strain sensors based on wafer-level vacuum packaged MEMS resonators 1-gen-2016 Belsito, Luca; Ferri, Matteo; Mancarella, Fulvio; Masini, Luca; Yan, Jize; Seshia, Ashwin A.; Soga, Kenichi; Roncaglia, Alberto
Influence of Grain Size on the Thermoelectric Properties of Polycrystalline Silicon Nanowires 1-gen-2015 Suriano F;Ferri M;Moscatelli F;Mancarella F;Belsito L;Solmi S;Roncaglia A;Frabboni S;Gazzadi; G C;Narducci; D
Nanograin Effects on the Thermoelectric Properties of Poly-Si Nanowires 1-gen-2013 Neophytou, N; Zianni, X; Ferri, M; Roncaglia, A; Cerofolini, Gf; Narducci, D
Nanostrain Resolution Strain Sensing by Monocrystalline 3C-SiC on SOI Electrostatic MEMS Resonators 1-gen-2019 Belsito, L; Bosi, M; Mancarella, F; Ferri, M; Roncaglia, A
Phonon scattering enhancement in silicon nanolayers 1-gen-2013 Narducci, D; Cerofolini, G; Ferri, M; Suriano, F; Mancarella, F; Belsito, L; Solmi, S; Roncaglia, Alberto; A,
Phonon scattering enhancement in silicon nanolayers 1-gen-2012 Narducci, Dario; Cerofolini, Gianfranco; Ferri, Matteo; Suriano, Francesco; Mancarella, Fulvio; Belsito, Luca; Solmi, Sandro; Roncaglia, Alberto
RBS channeling analysis of ion irradiation effects in heavily doped Si:As 1-gen-2006 Lulli, G; Bianconi, M; Ferri, M; Fortunato, G; Mariucci, L