Nanophasic tungsten oxide thin films were deposited at 500 degreesC on quartz and glass substrates starting from W(CO)(6) using the metal organic chemical vapour deposition technique. The films were analysed by X-ray diffraction, X-ray photoelectron spectroscopy and scanning electron microscopy. By using an O-2 + H2O atmosphere, the fully oxidized tungsten yellow compound was obtained (tetragonal WO3) with a morphology characterized by pyramidal-shaped grains. The average crystallite size resulted of 75 nm. Conversely, under a N-2 + H-2 atmosphere, a polycrystalline blue deposit was obtained, corresponding mainly to a mixture of oxides in the composition range between WO2.7 and WO3. The crystallites have an average size of 50 nm and the morphology revealed a packed structure, with grains in a singular wool skein shape.

Structural and morphological analyses of tungsten oxide nanophasis thin films obtained by MOCVD

CARTA, GIOVANNI;BARRECA, DAVIDE;ROSSETTO, GILBERTO LUCIO;ZANELLA, PIERINO
2003

Abstract

Nanophasic tungsten oxide thin films were deposited at 500 degreesC on quartz and glass substrates starting from W(CO)(6) using the metal organic chemical vapour deposition technique. The films were analysed by X-ray diffraction, X-ray photoelectron spectroscopy and scanning electron microscopy. By using an O-2 + H2O atmosphere, the fully oxidized tungsten yellow compound was obtained (tetragonal WO3) with a morphology characterized by pyramidal-shaped grains. The average crystallite size resulted of 75 nm. Conversely, under a N-2 + H-2 atmosphere, a polycrystalline blue deposit was obtained, corresponding mainly to a mixture of oxides in the composition range between WO2.7 and WO3. The crystallites have an average size of 50 nm and the morphology revealed a packed structure, with grains in a singular wool skein shape.
2003
CHIMICA INORGANICA E DELLE SUPERFICI
Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia - ICMATE
Istituto di Scienze e Tecnologie Molecolari - ISTM - Sede Milano
532-5
439
443
Tungsten oxide
Chemical vapor deposition
X-ray photoelectron spectroscopy
Scanning electron microscopy SEM
Surface structure
4
info:eu-repo/semantics/article
262
Barreca D., Bozza S., Carta G., Rossetto G., Tondello E., Zanella P.
01 Contributo su Rivista::01.01 Articolo in rivista
none
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/150529
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 27
  • ???jsp.display-item.citation.isi??? ND
social impact